Materials Science

We work closely with cutting edge material scientists bringing them the latest enabling technologies in microscopy & microanalysis, fabrication, optics and surface chemical sciences.

TESCAN SOLARIS

Battery & Energy

Advanced technology to assist research in battery and energy storage development

TESCAN SOLARIS

Chemistry

The latest tools to assist researchers developing advanced materials, devices and applications

TESCAN SOLARIS

Crystallography

Revolutionary hardware and software technology facilitating advanced 3D structure determination, for small and macromolecules

TESCAN SOLARIS

Electronics & Optics

Cutting-edge tools for research development in electronics and optics

TESCAN SOLARIS

Engineering & Materials

The latest technology for the development and innovation into engineering and materials research

TESCAN SOLARIS

Surface Sciences

State of the art tools for all your surface science needs

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Our Materials Sciences Team

Kamran Khajepour
Materials and Nanotechnology Manager
Electron Microscopy, Raman Spectroscopy, Material Science, Nano Fabrication, Music Performance.
Peter Airey
Materials and Nanotechnology Specialist
With a background in materials chemistry, and an avid interest in science and technology, I am passionate about realising the potential for researchers to gain access to the latest technologies to futhur their understanding in Materials Science and Nanotechnology.
Nav Dhaliwal
Business Development and Product Manager
Specialising in X-ray Diffraction Techniques, Crystallography, SAXS and X-ray Components (sources and detectors).
Having previously worked at Rigaku it is wonderful to be able to represent them with AXT in the Pacific Rim.

Products

Filter by Technique

All
AFM/SPM/SNOM
Electron Microscopy
In situ
LIBS
Microscopy
Multiphoton Microscopy
Sample Preparation
Spectroscopy
X-ray Imaging
XPS/UPS/Auger
XRD
XRF

TESCAN SOLARIS

TESCAN SOLARIS

Highest quality TEM lamellae preparation and superior analytical performance

TESCAN SOLARIS X

TESCAN SOLARIS X

Electron MicroscopyMicroscopy

Solaris X
Xe plasma FIB-SEM for Semiconductors

ZSX Primus III+

ZSX Primus III+

XRF

Excellent value and performance system for labs and minesites requiring rapid elemental analysis.

CT Lab HX130

CT Lab HX130

Benchtop ergonomics Computed Tomography for materials science

ZSX Primus

ZSX Primus

XRF

High power tube below WDXRF, with closely coupled optics and a high intensity 30 micron tube window X-Ray Tube, for unsurpassed light element performance.

chameleon

chameleon

Electron MicroscopyMicroscopy

Rapid progress to the perfect ice thickness for your cryo-EM sample

QuantumLeap XAS

QuantumLeap XAS

Spectroscopy

X-ray Absorption Spectroscopy (XAS)

NEXSA

NEXSA

SpectroscopyXPS/UPS/Auger

Nexsa X-Ray Photoelectron Spectrometer (XPS) System

Ntegra

Ntegra

AFM/SPM/SNOM

NTEGRA is a multi-functional device capable of performing more than 40 measuring methods This versatility allows analysis of physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment.

NanoFrazor Explore

NanoFrazor Explore

The NanoFrazor Explore has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features combined with an integrated direct laser writer option for large feature patterning

QM Quantum Microscope

QM Quantum Microscope

Completely configurable, the QM comprises a laser source (EUV and/or VUV), amplifier, beamline tailored to the user’s experiment, and imaging or other analysis workstations that can effectively cover the microscopy/spectroscopy landscape for nano-to-quantum materials

XUUS4

XUUS4

Spectroscopy

A bench top source for EUV and soft X-rays

AttoMap

AttoMap

XRF

High resolution micro-XRF

Y-Fi VUV – vacuum ultraviolet source

Y-Fi VUV – vacuum ultraviolet source

KMLabs Y-Fi™ VUV provides bright femtosecond pulses at numerous wavelengths across the vacuum ultraviolet (VUV) region, from 6.0 eV (205 nm) to 10.8 eV (115 nm). The discrete tunability of the KMLabs Y-Fi VUV vacuum ultraviolet source enables researchers to study a wide range of materials and materials properties

RAEA Amplifier

RAEA Amplifier

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC

SPARC

Spectroscopy

SPARC: High-performance SEM cathodoluminescence detector

FF35 CT

FF35 CT

X-ray Imaging

High resolution industrial CT system for small/medium sized parts inspection

FF20 CT

FF20 CT

X-ray Imaging

Ultimate automated semiconductor analysis

Y-Fi™ ULTRAFAST Yb FIBER LASERS

Y-Fi™ ULTRAFAST Yb FIBER LASERS

Multiphoton Microscopy

A unique, world-leading, series of high average power, multi-MHz repetition-rate ultrafast fiber lasers

Eucentric Five Axis Table

Eucentric Five Axis Table

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

TESCAN DynaTOM

TESCAN DynaTOM

In situX-ray Imaging

A dedicated 4D X-ray imaging

Rod Crusher

Rod Crusher

Sample Preparation

Contactless crushing of high purity products with less than parts per trillion levels of introduced contamination

Model 2550 Cryo Transfer Tomography Holder

Model 2550 Cryo Transfer Tomography Holder

Electron MicroscopyIn situ

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Model 1070 NanoClean

Model 1070 NanoClean

Electron Microscopy

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Model 1051 TEM Mill

Model 1051 TEM Mill

Table top precision preparation for producing high quality TEM samples for a wide variety of applications

Model 1080 PicoMill

Model 1080 PicoMill

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest

Model 1061 SEM Mill

Model 1061 SEM Mill

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

Heating Module

Heating Module

In situ

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

Electron MicroscopyIn situ

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Electrostatic Beam Blanker

Electrostatic Beam Blanker

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

SEM Add-on Tools

SEM Add-on Tools

In situ

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Transfer Module

Transfer Module

Electron MicroscopyIn situ

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Bending Module

Bending Module

In situ

World leading in situ materials testing of bending characteristics using your SEM

Solver Nano

Solver Nano

AFM/SPM/SNOM

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.

NEXT II

NEXT II

AFM/SPM/SNOM

NEXT II provides motorised sample positioning and integrated high resolution optical microscope positioning, motorised continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorisation. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution.

Anti Curtaining Table

Anti Curtaining Table

A four-axis positioning tool especially designed to allow rocking a sample while observing it with both the electron and ion beams. It provides an additional tilt axis that is
perpendicular to the FIB-SEM’s stage’s tilt axis allowing for rocking of the sample back and forth on an axis that is perpendicular to the focussed ion beam

DE-64

DE-64

Electron Microscopy

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-20

DE-20

Electron Microscopy

Specifically designed for low-dose applications, the DE-20 features the 9th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading low-noise images, excellent signal-to-noise ratio, and flexible “movie-mode” for fluid, dynamic viewing.

DE-16

DE-16

Electron Microscopy

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

DE-DirectView

Electron Microscopy

With high sensitivity and excellent resolution, the DE-DirectView offers cost-effective direct detection for biological and material science applications.

Lumis EBSD Detector

Lumis EBSD Detector

Rapidly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology designed for maximum throughput and high resolution. The Thermo Scientific™ Lumis EBSD detector incorporates new CMOS sensor technology and advanced optics

XRTmicron

XRTmicron

XRD

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

Quasor II™ EBSD System

Quasor II™ EBSD System

Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterises crystalline structures which affect physical properties in a wide range of materials examined with scanning electron microscopes (SEMs) and X-ray microanalysis

RH-2000

RH-2000

Microscopy

Highly Customisable digital microscope for 2D and 3D examination and analysis of samples from 0x to 10,000x magnification

TESCAN MIRA

TESCAN MIRA

Electron MicroscopyIn situ

Versatile and powerful FEG SEM

XCITE™

XCITE™

Microscopy

Synchrotron and versatile performance X-ray source

TESCAN CoreTOM

TESCAN CoreTOM

In situX-ray Imaging

Multiscale 3D core imaging

8000M Mixer/Mill®

8000M Mixer/Mill®

Sample PreparationXRF

High-energy ball mill esp. useful for XRF and XRD Sample Prep.
8000M Mixer/Mill

8000D Mixer/Mill®

8000D Mixer/Mill®

Sample PreparationXRF

High-energy Dual ball mill esp. useful for XRF and XRD Sample Prep..
8000D Mixer/Mill

TESCAN UniTOM XL

TESCAN UniTOM XL

In situX-ray Imaging

A unique alternative in Dynamic 3D X-ray imaging for your lab

Model 1040 NanoMill

Model 1040 NanoMill

Electron Microscopy

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

JOLT

JOLT

Panchromatic and RGB Cathodoluminescence (CL) detector

Z-300 LIBS Handheld Analyser

Z-300 LIBS Handheld Analyser

LIBS

The best portable instrument for the exploration geologist. Analysing every element of the periodic table including the elements the pXRF cannot see.

TESCAN VEGA

TESCAN VEGA

Electron MicroscopyIn situ

Versatile and powerful tungsten SEM

XtaLAB mini II

XtaLAB mini II

XRD

mount, collect, solve, publish

MiniFlex 6G

MiniFlex 6G

XRD

The Leading Light of Benchtop X-ray Diffractometery

TESCAN AMBER

TESCAN AMBER

Electron MicroscopyIn situMicroscopy

TESCAN AMBER X; the most versatile and universal analytical Xe plasma FIB-SEM platform in the market

TESCAN AMBER X

TESCAN AMBER X

Electron MicroscopyIn situMicroscopy

TESCAN AMBER X - the most modern Xe plasma FIB SEM

NANOPIX mini

NANOPIX mini

XRD

The world's first benchtop SAXS instrument

NANOPIX

NANOPIX

XRD

Synchrotron level SAXS performance at your fingertips

SmartLab SE

SmartLab SE

XRD

Multipurpose XRD and Materials Analysis

SmartLab

SmartLab

XRD

The pinnacle instrument for X-ray materials analysis

XtaLAB Synergy-R

XtaLAB Synergy-R

XRD

X-ray crystallography at it's finest

XtaLAB Synergy-i

XtaLAB Synergy-i

XRD

Beauty in the simplicity of design

XtaLAB Synergy-DW

XtaLAB Synergy-DW

XRD

X-ray crystallography at it's finest

XtaLAB Synergy-Custom

XtaLAB Synergy-Custom

XRD

Your customised Home-Lab Light Source for X-ray Crystallography and BioSAXS

X-Series XRF Handheld Analysers

X-Series XRF Handheld Analysers

XRF

The world’s lightest, smallest, fastest, high precision family of XRF analyzers.

Lab

Lab

Sample Preparation

Selective fragmentation for liberating material along their grain boundaries

OM100 Dual Action Jaw Crusher

OM100 Dual Action Jaw Crusher

Sample PreparationXRF

The only crusher that crushes rocks from 140mm to 2 mm in a single pass

Katanax X-300

Katanax X-300

Sample PreparationXRF

A tried and tested electric fusion machine with a robust design for speed and simplicity. Designed for 1 to 3 samples for XRF fused bead or ICP/AAS dissolution. High accuracy, automated operation and high through-put rates makes it ideal for research and industrial labs.

Katanax X-600

Katanax X-600

Sample PreparationXRF

A tried and tested electric fusion machine with a robust design for speed and simplicity. Designed for preparing up to 6 samples for XRF fused bead or ICP/AAS dissolution. High accuracy, automated operation and high through-put rates makes it ideal for research and industrial labs.

XtaLAB Synergy-S

XtaLAB Synergy-S

XRD

The world's favourite X-ray crystallography system

Ti:Sapphire Laser Oscillators

Ti:Sapphire Laser Oscillators

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

NanoFrazor Scholar

NanoFrazor Scholar

The NanoFrazor Scholar has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features in a bench top design

Simultix 15

Simultix 15

XRF

High Power tube above simultaneous WDXRF, for high-throughput elemental analysis of solids, powders and alloys.

Supermini200

Supermini200

XRF

High-power benchtop sequential WDXRF spectrometer.

Cheetah EVO 2D/3D Inspection System

Cheetah EVO 2D/3D Inspection System

X-ray Imaging

The Cheetah EVO Plus includes new and improved features that make the system ready for the paradigm shift to a smart factory

Cougar EVO Series

Cougar EVO Series

X-ray Imaging

Scalable small footprint X-ray inspection systems for electronic componentry, and medical/military devices

MU2000-D

MU2000-D

X-ray Imaging

YXLON MU2000-D is a robust, reliable X-ray and CT inspection system for industrial and academic applications

ZSX Primus IV

ZSX Primus IV

XRF

Powerful tube above WDXRF for quantitative elemental analysis with mapping and multi-point capability

Z-200 & Z-200C+ LIBS Handheld Analysers

Z-200 & Z-200C+ LIBS Handheld Analysers

LIBS

The only handheld analyser that accurately measures carbon content in metals and other materials

Compact Light Source

Compact Light Source

X-ray ImagingXRD

MM3E Micromanipulator

MM3E Micromanipulator

Electron MicroscopyIn situ

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

In situ

World leading in situ materials testing of tensile and compression characteristics using your SEM

SuperFlat AFM

SuperFlat AFM

AFM/SPM/SNOMIn situ

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

EBIC Characterisation System

EBIC Characterisation System

In situ

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

Climate

Climate

In situ

The Climate gas & heating solution enables dynamic studies of cyclic specimen transformations in gaseous environments at elevated temperatures and sub-Angstrom level.

Wildfire

Wildfire

In situ

Wildfire In situ TEM Heating

Lightning

Lightning

In situ

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream

Stream

In situ

STREAM; In Situ TEM Liquid, Liquid Biasing and Liquid Heating

NanoWorkstation

NanoWorkstation

In situ

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

NANORO M

NANORO M

Microscopy

Nanoro M- Super Resolution Optical Microscopy

Model 2020 Advanced Tomography Holder

Model 2020 Advanced Tomography Holder

In situ

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries