Materials Science

We work closely with cutting edge material scientists bringing them the latest enabling technologies in microscopy & microanalysis, fabrication, optics and surface chemical sciences.

Qualana – Micro-XRF

Additive Manufacturing

Additive manufacturing and 3D printing

Qualana – Micro-XRF

Battery & Energy

Advanced technology to assist research in battery and energy storage development

Qualana – Micro-XRF

Chemistry

The latest tools to assist researchers developing advanced materials, devices and applications

Qualana – Micro-XRF

Crystallography

Revolutionary hardware and software technology facilitating advanced 3D structure determination, for small and macromolecules

Qualana – Micro-XRF

Electronics & Optics

Cutting-edge tools for research development in electronics and optics

Qualana – Micro-XRF

Engineering & Materials

The latest technology for the development and innovation into engineering and materials research

Qualana – Micro-XRF

Surface Sciences

State of the art tools for all your surface science needs

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Latest Review

The new DENSsolutions stub is very useful when making samples for in-situ TEM heating and biasing experiments. The refined copper clamping system makes it easy to mount the chip in a safe way, while it is grounded at the same time to prevent charging. By using the angle of 45 degrees it is possible to finish a complete sample in one go without the system having to be aerated. So I am also very satisfied with this stub that makes work easier for me

Stijn van den BroeckElectron Microscopy for Materials Science (EMAT) Antwerp

Products

Filter by Technique

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Additive Manufacturing
AFM/SPM/SNOM
Bioprinting
Computed Tomography - Life Sci
Electron Microscopy
In situ
LALI-TOF-MS - Laser Ablation Laser Induced Time of Flight Mass Spectrometry
Mass Spectrometry
Microscopy
NMR
Sample Preparation
Spectroscopy
X-ray Imaging
XRD & Diffraction
XRF

HRX-02 – 3D Digital Zoom Microscope

HRX-02 – 3D Digital Zoom Microscope

Additive Manufacturing

High-performance digital microscope

LVEM 5 Benchtop Low Voltage TEM

LVEM 5 Benchtop Low Voltage TEM

Nanoscale imgaing from your benchtop

LVEM 25E Low Voltage TEM

LVEM 25E Low Voltage TEM

Electron Microscopy

All in one TEM, SEM, STEM, ED and EDS with performance equivalent to larger systems

MIRA XR – Sub-nm FEG-SEM

MIRA XR – Sub-nm FEG-SEM

Simplified UHR-SEM-EDS for rapid and precise materials analysis

Mini Transfer Module for Sensitive SEM Samples

Mini Transfer Module for Sensitive SEM Samples

Mini Transfer Module transporting air and moisture sensitive samples to and from SEM and glove box

d5 - Highly Configurable CT System

d5 - Highly Configurable CT System

Ideal for those wanting a no compromise CT

d4 - Compact CT for Large Parts

d4 - Compact CT for Large Parts

Examine large components at high resolution

d3 - Compact Flexible microCT

d3 - Compact Flexible microCT

The ultimate in flexibility in a compact footprint

d2 - Versatile microCT for Small to Medium Samples

d2 - Versatile microCT for Small to Medium Samples

Highly adaptable modular design for academic or industrial applications

d1 - microCT for Small to Medium Samples

d1 - microCT for Small to Medium Samples

Combining high spatial and temporal resolution

MQC-R Benchtop NMR

MQC-R Benchtop NMR

NMR

Flexible benchtop TD-NMR instrument

ASA Nanoindenter - Micromechanical Testing System

ASA Nanoindenter - Micromechanical Testing System

In situ

High-precision nanoindenter that can be customised with a range of accessories, consumables and controllers

Ultra High Strain Rate (UHS) Module

Ultra High Strain Rate (UHS) Module

In situ

Redefining the boundaries of high strain rate and impact testing

LTM-Cryo Low Temperature Module

LTM-Cryo Low Temperature Module

In situ

Retrofittable to the Alemnis ASA Nanoindenter/Micromechanical testing system

HTM-1000 High Temperature Module

HTM-1000 High Temperature Module

In situ

Retrofittable to the Alemnis ASA Nanoindenter/Micromechanical testing system

Massbox – LALI-TOF-MS

Massbox – LALI-TOF-MS

LALI-TOF-MS - Laser Ablation Laser Induced Time of Flight Mass SpectrometryMass Spectrometry

Patented technology with trace element sensitivity, delivering results in minutes from a compact, user-friendly system

Prime 4K – 3D High-Resolution DLP Resin Printer

Prime 4K – 3D High-Resolution DLP Resin Printer

Additive ManufacturingBioprinting

Affordable DLP resin printer for microfluidics and dental

Cathodyne - Optical Cathodoluminescence

Cathodyne - Optical Cathodoluminescence

A fast and sensitive optical CL imaging system that uses a plasma source and doesn't need a SEM to work.

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

ExoSEM - Ex Situ Bench for Thermo-Mechanical Testing

In situ

360° viewing during a thermal or thermomechanical test outside your SEM

FurnaSEM - in situ SEM Furnace

FurnaSEM - in situ SEM Furnace

In situ

In Situ SEM furnace ideal for high temperature studies up to 1300°C. perform dynamic studies inside your SEM or under an optical microscope.

MT 1000 Tensile/Compression Stage

MT 1000 Tensile/Compression Stage

In situ

The most precise and functional thermo-mechanical testing system on the market

ZSX Primus IVi - WDXRF Spectrometer

ZSX Primus IVi - WDXRF Spectrometer

XRF

Powerful WDXRF for quantitative elemental analysis with mapping and multi-point capability

TESCAN TENSOR - 4D STEM

TESCAN TENSOR - 4D STEM

A STEM that is as easy to use as a SEM

microArch Industrial Micro Precision 3D Printers

microArch Industrial Micro Precision 3D Printers

Additive Manufacturing

Ultra-high resolution, accuracy and precision

UHV FIB-SEM NanoSpace

UHV FIB-SEM NanoSpace

AFM/SPM/SNOMElectron Microscopy

A versatile platform ideally suited to FIB-SEM applications in an UHV and contamination free environment

Model 1062 TrionMill

Model 1062 TrionMill

Electron Microscopy

Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses at shortest possible time and largest possible size.

TESCAN UniTOM HR 2

TESCAN UniTOM HR 2

The world's first sub-micron 600nm dynamic micro-CT allowing true 4D scanning with a temporal resolution of 5 seconds.

LiteScope - AFM in Your SEM

LiteScope - AFM in Your SEM

AFM/SPM/SNOMElectron Microscopy

Correlative in situ AFM and SEM

NanoOne

NanoOne

Additive Manufacturing

NanoOne high throughput 3D printer with sub-micron resolution

Celeritas / Celeritas XS

Celeritas / Celeritas XS

A revolutionary new direct detection camera for four-dimensional scanning transmission electron microscopy (4D STEM) delivering more speed, more pixels and exceptional image quality.

SmartLab

SmartLab

XRD & Diffraction

The pinnacle instrument for X-ray materials analysis

XtaLAB Synergy-DW - Dual Wavelength Single Crystal XRD

XtaLAB Synergy-DW - Dual Wavelength Single Crystal XRD

XRD & Diffraction

X-ray crystallography at it's finest

XtaLAB Synergy-R

XtaLAB Synergy-R

XRD & Diffraction

X-ray crystallography at it's finest

XtaLAB Synergy-S

XtaLAB Synergy-S

XRD & Diffraction

The world's favourite X-ray crystallography system

ZSX Primus IV - High-Througput Tube Above XRF

ZSX Primus IV - High-Througput Tube Above XRF

XRF

Powerful tube above WDXRF for quantitative elemental analysis with mapping and multi-point capability

XtaLAB Synergy-i

XtaLAB Synergy-i

XRD & Diffraction

Beauty in the simplicity of design

Apollo

Apollo

Electron Microscopy

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

TESCAN VEGA Compact

TESCAN VEGA Compact

Electron MicroscopyIn situ

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Supermini200

Supermini200

XRF

High-power benchtop sequential WDXRF spectrometer.

MiniFlex 6G

MiniFlex 6G

XRD & Diffraction

The Leading Light of Benchtop X-ray Diffractometery

Model 2560 Vacuum Transfer Tomography Holder

Model 2560 Vacuum Transfer Tomography Holder

Electron MicroscopyIn situ

An ideal platform to protect environmentally sensitive material during transfer to TEM’s

nano3DX

nano3DX

Computed Tomography - Life Sci

The Rigaku nano3DX is a true sub-micron high-contrast X-ray microscope / microCT / Computed Tomography system ideal for low contrast imaging.

Rigaku CT Lab HX

Rigaku CT Lab HX

Additive Manufacturing

Benchtop ergonomics Computed Tomography for materials science

FIB Stub 3.0

FIB Stub 3.0

In situ

Prepare lamellae directly on your Nano-chip inside your FIB

BM-200 Mixer/Mill<sup>®</sup>

BM-200 Mixer/Mill^®

Sample PreparationXRF

Efficient, compact laboratory mill.
BM-200 Mixer/Mill

TESCAN SOLARIS

TESCAN SOLARIS

Highest quality TEM lamellae preparation and superior analytical performance

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

TESCAN SOLARIS X - Xe Plasma FIB-SEM for Semiconductors

Electron MicroscopyMicroscopy

Xe plasma FIB-SEM for Semiconductors

QuantumLeap XAS

QuantumLeap XAS

Spectroscopy

X-ray Absorption Spectroscopy (XAS)

QM Quantum Microscope

QM Quantum Microscope

Completely configurable, the QM comprises a laser source (EUV and/or VUV), amplifier, beamline tailored to the user’s experiment, and imaging or other analysis workstations that can effectively cover the microscopy/spectroscopy landscape for nano-to-quantum materials

XUUS4

XUUS4

Spectroscopy

A bench top source for EUV and soft X-rays

Hyperion VUV – vacuum ultraviolet source

Hyperion VUV – vacuum ultraviolet source

KMLabs Hyperion VUV provides bright femtosecond pulses at numerous wavelengths across the vacuum ultraviolet (VUV) region, from 6.0 eV (205 nm) to 10.8 eV (115 nm). The discrete tunability of the KMLabs Hyperion VUV vacuum ultraviolet source enables researchers to study a wide range of materials and materials properties

RAEA Amplifier

RAEA Amplifier

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC

SPARC

Spectroscopy

SPARC: High-performance SEM cathodoluminescence detector

Eucentric Five Axis Table

Eucentric Five Axis Table

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

TESCAN DynaTOM

TESCAN DynaTOM

In situX-ray Imaging

A dedicated 4D X-ray imaging

Rod Crusher

Rod Crusher

Sample Preparation

Contactless crushing of high purity products with less than parts per trillion levels of introduced contamination

Model 2550 Cryo Transfer Tomography Holder

Model 2550 Cryo Transfer Tomography Holder

Electron MicroscopyIn situ

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Model 1070 NanoClean

Model 1070 NanoClean

Electron Microscopy

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Model 1051 TEM Mill

Model 1051 TEM Mill

Table top precision preparation for producing high quality TEM samples for a wide variety of applications

Model 1080 PicoMill

Model 1080 PicoMill

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest

Model 1061 SEM Mill

Model 1061 SEM Mill

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

Heating Module

Heating Module

In situ

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

Electron MicroscopyIn situ

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

SEM Peltier Module

SEM Peltier Module

In situ

With rapid temperature changes and precise control using a PID-controller, combined with quick lock connectors for fast turn around, makes this the perfect peltier stage

Electrostatic Beam Blanker

Electrostatic Beam Blanker

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

SEM Add-on Tools

SEM Add-on Tools

In situ

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Transfer Module

Transfer Module

Electron MicroscopyIn situ

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Bending Module

Bending Module

In situ

World leading in situ materials testing of bending characteristics using your SEM

Anti Curtaining Table

Anti Curtaining Table

A four-axis positioning tool especially designed to allow rocking a sample while observing it with both the electron and ion beams. It provides an additional tilt axis that is
perpendicular to the FIB-SEM’s stage’s tilt axis allowing for rocking of the sample back and forth on an axis that is perpendicular to the focussed ion beam

DE-64

DE-64

Electron Microscopy

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-16

DE-16

Electron Microscopy

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

DE-DirectView

Electron Microscopy

Excellent upgrade option for your existing TEM offering low dose imaging, electron counting and 4D STEM

XRTmicron

XRTmicron

XRD & Diffraction

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

TESCAN MIRA

TESCAN MIRA

Electron MicroscopyIn situ

Versatile and powerful FEG SEM

XCITE™ X-Ray Source

XCITE™ X-Ray Source

Microscopy

Synchrotron and versatile performance X-ray source

TESCAN CoreTOM

TESCAN CoreTOM

In situX-ray Imaging

Multiscale 3D core imaging

BM-400 Mixer/Mill®High-Energy Ball Mill

BM-400 Mixer/Mill®High-Energy Ball Mill

Sample PreparationXRF

High-energy ball mill esp. useful for XRF and XRD Sample Prep.
BM-400 Mixer/Mill

BM-450 Mixer/Mill®- Dual High-Energy Ball Mill

BM-450 Mixer/Mill®- Dual High-Energy Ball Mill

Sample PreparationXRF

High-energy Dual ball mill esp. useful for XRF and XRD Sample Prep..
BM-450 Mixer/Mill

TESCAN UniTOM XL

TESCAN UniTOM XL

In situX-ray Imaging

A unique alternative in Dynamic 3D X-ray imaging for your lab

Model 1040 NanoMill

Model 1040 NanoMill

Electron Microscopy

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

JOLT Cathodoluminescence Detector

JOLT Cathodoluminescence Detector

Panchromatic and RGB Cathodoluminescence (CL) detector

TESCAN VEGA

TESCAN VEGA

Electron MicroscopyIn situ

Analytical SEM for materials science and life science applications in research and industry

$XtaLAB mini II - Benchtop Single Crystal XRD Diffractometer$

XtaLAB mini II - Benchtop Single Crystal XRD Diffractometer

XRD & Diffraction

mount your crystal and walk away with AUTO collect, AUTO solve, AUTO publish

TESCAN AMBER 2 - Ga FIB-SEM

TESCAN AMBER 2 - Ga FIB-SEM

Electron MicroscopyIn situMicroscopy

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X 2 - Plasma FIB-SEM

TESCAN AMBER X 2 - Plasma FIB-SEM

Electron MicroscopyIn situMicroscopy

Combining the speed of a plasma FIB with the resolution of a Ga FIB

NANOPIX mini

NANOPIX mini

The world's first benchtop SAXS instrument

SmartLab SE

SmartLab SE

XRD & Diffraction

Multipurpose XRD and Materials Analysis

XtaLAB Synergy-Custom

XtaLAB Synergy-Custom

XRD & Diffraction

Your customised Home-Lab Light Source for X-ray Crystallography and BioSAXS

Lab

Lab

Sample Preparation

Selective fragmentation for liberating material along their grain boundaries

Environmental Express® Katanax® X-300 Fusion Fluxer

Environmental Express® Katanax® X-300 Fusion Fluxer

Sample PreparationXRF

A tried and tested electric fusion machine with a robust design for speed and simplicity. Designed for 1 to 3 samples for XRF fused bead or ICP/AAS dissolution. High accuracy, automated operation and high through-put rates makes it ideal for research and industrial labs.

Environmental Express® Katanax® X-600 Fusion Fluxer

Environmental Express® Katanax® X-600 Fusion Fluxer

Sample PreparationXRF

A tried and tested electric fusion machine with a robust design for speed and simplicity. Designed for preparing up to 6 samples for XRF fused bead or ICP/AAS dissolution. High accuracy, automated operation and high through-put rates makes it ideal for research and industrial labs.

Ti:Sapphire Laser Oscillators

Ti:Sapphire Laser Oscillators

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

Simultix 15 - High-Speed Simultaneous XRF

Simultix 15 - High-Speed Simultaneous XRF

XRF

High Power tube above simultaneous WDXRF, for high-throughput elemental analysis of solids, powders and alloys.

MM3E Micromanipulator

MM3E Micromanipulator

Electron MicroscopyIn situ

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

In situ

World leading in situ materials testing of tensile and compression characteristics using your SEM

SuperFlat AFM

SuperFlat AFM

AFM/SPM/SNOMIn situ

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

EBIC Characterisation System

EBIC Characterisation System

In situ

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

Climate∞

Climate∞

In situ

Characterise your materials with sub-Angstrom resolution with dynamic studies featuring precise control over electrical, thermal and gas environments

Wildfire

Wildfire

In situ

Wildfire In situ TEM Heating

Lightning

Lightning

In situ

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream∞

Stream∞

In situ

In situ TEM liquid platform with heating and biasing

NanoWorkstation

NanoWorkstation

In situ

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

Model 2020 Advanced Tomography Holder

Model 2020 Advanced Tomography Holder

In situ

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries