TESCAN VEGA Compact

The superior alternative to most benchtop SEMs

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

  • TESCAN VEGA Compact SEM - a superior alternative to benchtop SEMs

    Key Features

    • Fully integrated imaging and EDS - Essence EDS combines SEM imaging and elemental composition in a single window
    • Optimal imaging and analytical conditions - Optimised using TESCAN’s in-flight beam tracing
    • Simplified navigation - Using TESCAN’s Wide Field Optics locate areas of interest from as low as 2x magnification
    • Deals with charging and beam sensitive samples with just one click - Using SingleVac mode
    • Effortless and customisable user interface - Essence software simplifies operation and allows each user to customise their own workflow
    • Expandable analytical capabilities - Designed for incorporation of extra detectors e.g. WDS, EBSD, CL etc.
    • A highly sophisticated motorised 5-axis stage - Allows for automated procedures such as large area imaging, saving point of interest, etc.
    • Fully automated column - No mechanical centring elements, enables fully automated column set-up and alignment

The TESCAN VEGA Compact is an affordable, compact SEM ideal for testing labs dealing with routine inspection as well as university labs where it nakes an ideal teaching or workhorse instrument.

With its simple operation and integrated EDS it provides excellent imaging and analytical capabilities. Furthermore, it can be installed in just a few hours and required no special infrastructure.

Compared to most benchtop SEMs it:

  • Provides superior imaging capabilities
  • Offers superior EDS data collection conditions
  • Has superior versatility with the ability to add more detectors
  • Costs about the same and is often cheaper than many benchtop SEMs
  • Is small enough to fit into most labs
  • Is supported by AXT’s extensive service network in the off chance maintenance is required

Read more about how the TESCAN VEGA Compact is the ideal SEM for small labs and teaching applications.

  • Live EDS on TESCAN VEGA

    Live View Window with Integrated EDS

    TESCAN VEGA integrates SEM imaging and optional Essence™ EDS in one live view window to make analytical operation fast and easy. Essence™ EDS is as simple as a single mouse click optimising all set-up parameters through the software, initiating elemental analysis of the sample. Fully integrated Essence provides immediate access to the elemental spectrum at any point or region, presenting the data as an elemental map or point/line EDS spectra.

     

  • TESCAN VEGA optimal imaging conditions

    Optimised Imaging and Analytical Conditions

    An innovative optics design guarantees immediate and seamless selection of either imaging or analytical conditions as required, without the need for mechanical re-alignment of any in-colum element. Using a unique additional Intermediate Lens™ powered by TESCAN’s In-Flight Beam Tracing™, you can continuously increase beam current to a value that optimises signal to noise ratio for imaging at the desired magnifications and accelerating voltages.

    Furthermore, switching from low voltage imaging mode to high voltage analytical modes is achieved with a single mouse click.

    Caption – Metal fracture with a surface contamination captured at 5, 10 and 30 keV respectively. BSE information differs significantly from the increased surface sensitivity characteristic of lower accelerating energies

  • TESCAN VEGA Simplified navigation

    Precise SEM Navigation

    TESCAN’s unique Wide Field Optics™ mode provides you with a live SEM overview and a more intuitive navigation process with an unprecedented depth of field and a view o the sample’s actual topography. Continuously zoom in on your area of interest from 2x magnification using the live SEM view window.

  • TESCAN VEGA unque Essence user interface

    Intuitive and Modular Essence User Interface

    The 4th generation VEGA benefits from TESCAN’s Essence multi-user software interface which has been designed so that each user can streamline the user interface to their own specific requirements. This allows you to define workflows that match their level of experience and/or specific application need.

    Caption – Essence™ software layout

  • TESCAN VEGA - Singe Vac mode for craging and beam sensitive materials

    SingleVac Mode for Charging and Beam Sensitive Materials

    Supplied as standard, SingleVac mode uses factory-preset pressure to optimise imaging conditions of charging samples without the need for conductive coatings.

    Caption – Geological sample (left); Tree leaf (middle) and Ceramic (right) imaged with 4QBSE detector Color mode
    in SingleVac™ mode.

  • All
  • AFM/SPM/SNOM
  • ARPES
  • Automated Mineralogy
  • Biological Microscopy
  • CL
  • CLEM
  • Computed Tomography
  • Diffraction Imaging
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Laser spectroscopy
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Protein
  • Protein Crystallography
  • Raman
  • SEM
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • WDS
  • X-ray Imaging
  • X-ray Microscopy