METEOR

Integrated top down cryo-CLEM imaging system

METEOR is the world’s first and only fully integrated solution to optimise the cryo-ET workflow by reducing complicated transfer steps and increasing sample yield

  • Delmic meteor world's first fully integrated cryo-CLEM imaging system

    Key Features

    • FM enables region of interest (ROI) finding within the FIB/SEM chamber and therefore better lamella targeting
    • Integrated cryo CLEM allows for better XY correlation as the same sample stage and coordinates are used
    • Provides the ability to inspect lamellae for ROI inclusion during and after milling. Take only the useful lamellae to the cryo TEM.
    • Removing the transfer steps between LM and SEM reduces the risks of sample damage (devitrification/mechanical) and ice contamination
    • FM imaging in a high vacuum environment means lower ice deposition rate compared with ambient conditions
    • Easily adaptable to the users’ current workflow (plunge freezing/ HPF)

Integrated top down cryo-CLEM imaging system

METEOR is the world’s first and only fully integrated solution to optimise the cryo-ET workflow by reducing complicated transfer steps and increasing sample yield

  • Delmic Meteor 7 step simplified workflow

    Optimised Cryo-ET Workflow – Just 7 Steps

    METEOR can reduce the complexity of cryo-correlated light and electron microscopy (CLEM) workflow greatly by removing many transfer steps in the current laborious lamella preparation workflow. Traditional workflows can include as many as 22 steps. METEOR reduces this to just 7 fabrication steps:

    1. Load your sample
    2. Capture FLM image
    3. SEM image without sample transfer
    4. Directly move to the region of interest (ROI) after correlating the two images
    5. Mill your lamella
    6. Confirm the presence of ROI with FM
  • Delmic meteor cryo-ET applications

    Applications

    METEOR has a range of application in life science/biological imaging including:

    • Virology
    • Neuroscience
    • Cell Biology
  • All
  • AFM/SPM/SNOM
  • Automated Mineralogy
  • CL
  • CLEM
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Raman
  • SEM
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • WDS