Nanotechnology

Cutting edge instrumentation for both nano-fabrication and nano-characterisation

TESCAN SOLARIS

Biomaterials

The latest technology for research into advanced biomaterials

TESCAN SOLARIS

Fabrication

Advanced tools to assist researchers in nano-fabrication

TESCAN SOLARIS

Nano Materials

The latest technology for advancing research in nano-materials

TESCAN SOLARIS

Optics

The latest instruments for photonics research

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Our Nanotechnology Team

Kamran Khajepour
Materials and Nanotechnology Manager
Electron Microscopy, Raman Spectroscopy, Material Science, Nano Fabrication, Music Performance.
Peter Airey
Materials and Nanotechnology Specialist
With a background in materials chemistry, and an avid interest in science and technology, I am passionate about realising the potential for researchers to gain access to the latest technologies to futhur their understanding in Materials Science and Nanotechnology.
Nav Dhaliwal
Business Development and Product Manager
Specialising in X-ray Diffraction Techniques, Crystallography, SAXS and X-ray Components (sources and detectors).
Having previously worked at Rigaku it is wonderful to be able to represent them with AXT in the Pacific Rim.

Products

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AFM/SPM/SNOM
Biological Microscopy
Electron Microscopy
Fabrication
In situ
LIBS
Micro XRF
Microscopy
Spectroscopy
Super Resolution Microscopy
Thermal Probe Lithography
X-ray absorption spectroscopy (XANES/EXAFS)
X-ray Imaging
X-ray Microscopy
XPS/UPS/Auger
XRF

TESCAN SOLARIS

TESCAN SOLARIS

Highest quality TEM lamellae preparation and superior analytical performance

TESCAN SOLARIS X

TESCAN SOLARIS X

Electron MicroscopyFabricationMicroscopy

Solaris X
Xe plasma FIB-SEM for Semiconductors

QuantumLeap XAS

QuantumLeap XAS

SpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

X-ray Absorption Spectroscopy (XAS)

NEXSA

NEXSA

SpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)XPS/UPS/Auger

Nexsa X-Ray Photoelectron Spectrometer (XPS) System

Ntegra

Ntegra

AFM/SPM/SNOM

NTEGRA is a multi-functional device capable of performing more than 40 measuring methods This versatility allows analysis of physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment.

NanoFrazor Explore

NanoFrazor Explore

FabricationThermal Probe Lithography

The NanoFrazor Explore has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features combined with an integrated direct laser writer option for large feature patterning

XUUS4

XUUS4

SpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

A bench top source for EUV and soft X-rays

AttoMap

AttoMap

Micro XRFXRF

High resolution micro-XRF

RAEA Amplifier

RAEA Amplifier

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC

SPARC

Spectroscopy

SPARC: High-performance SEM cathodoluminescence detector

Eucentric Five Axis Table

Eucentric Five Axis Table

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

Electron MicroscopyIn situ

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Transfer Module

Transfer Module

Electron MicroscopyIn situ

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Solver Nano

Solver Nano

AFM/SPM/SNOM

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.

NEXT II

NEXT II

AFM/SPM/SNOMBiological Microscopy

NEXT II provides motorised sample positioning and integrated high resolution optical microscope positioning, motorised continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorisation. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution.

DE-64

DE-64

Electron Microscopy

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

DE-20

DE-20

Electron Microscopy

Specifically designed for low-dose applications, the DE-20 features the 9th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading low-noise images, excellent signal-to-noise ratio, and flexible “movie-mode” for fluid, dynamic viewing.

DE-16

DE-16

Electron Microscopy

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

DE-DirectView

DE-DirectView

Electron Microscopy

With high sensitivity and excellent resolution, the DE-DirectView offers cost-effective direct detection for biological and material science applications.

XRTmicron

XRTmicron

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

RH-2000

RH-2000

Biological MicroscopyMicroscopy

Highly Customisable digital microscope for 2D and 3D examination and analysis of samples from 0x to 10,000x magnification

TESCAN MIRA

TESCAN MIRA

Electron MicroscopyIn situMicro XRF

Versatile and powerful FEG SEM

Model 1040 NanoMill

Model 1040 NanoMill

Electron Microscopy

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

JOLT

JOLT

Panchromatic and RGB Cathodoluminescence (CL) detector

Z-300 LIBS Handheld Analyser

Z-300 LIBS Handheld Analyser

LIBS

The best portable instrument for the exploration geologist. Analysing every element of the periodic table including the elements the pXRF cannot see.

TESCAN VEGA

TESCAN VEGA

Electron MicroscopyIn situMicro XRF

Versatile and powerful tungsten SEM

TESCAN AMBER

TESCAN AMBER

Electron MicroscopyFabricationIn situMicroscopyThermal Probe Lithography

TESCAN AMBER X; the most versatile and universal analytical Xe plasma FIB-SEM platform in the market

TESCAN AMBER X

TESCAN AMBER X

Electron MicroscopyFabricationIn situMicroscopyThermal Probe Lithography

TESCAN AMBER X - the most modern Xe plasma FIB SEM

NANOPIX mini

NANOPIX mini

The world's first benchtop SAXS instrument

NANOPIX

NANOPIX

Synchrotron level SAXS performance at your fingertips

SmartLab

SmartLab

The pinnacle instrument for X-ray materials analysis

Ti:Sapphire Laser Oscillators

Ti:Sapphire Laser Oscillators

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

NanoFrazor Scholar

NanoFrazor Scholar

FabricationThermal Probe Lithography

The NanoFrazor Scholar has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features in a bench top design

Compact Light Source

Compact Light Source

X-ray absorption spectroscopy (XANES/EXAFS)X-ray ImagingX-ray Microscopy

MM3E Micromanipulator

MM3E Micromanipulator

Electron MicroscopyIn situ

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

In situ

World leading in situ materials testing of tensile and compression characteristics using your SEM

SuperFlat AFM

SuperFlat AFM

AFM/SPM/SNOMIn situ

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

Wildfire

Wildfire

In situ

Wildfire In situ TEM Heating

Lightning

Lightning

In situ

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream

Stream

In situ

STREAM; In Situ TEM Liquid, Liquid Biasing and Liquid Heating

NanoWorkstation

NanoWorkstation

In situ

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

NANORO M

NANORO M

MicroscopySuper Resolution Microscopy

Nanoro M- Super Resolution Optical Microscopy

ProbeWorkstation

ProbeWorkstation

In situ

The ProbeWorkstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.