Model 1040 NanoMill

NanoMill TEM specimen preparation system

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

  • Key Features

    • Achieve ultimate specimen quality free from amorphous and implanted layers
    • Complements FIB technology by removing damaged areas and Milling without introduction of artefacts
    • In situ imaging with ions and electrons to lacoate the lamela precisely
    • Ultra-low ion energies inert gas Low energy Ar source (50 eV to 2 kV) with sub-micron beam diameter
    • Software controlled operation Total control of all milling/polishing parameters Storage of recipes for rapid recall
  • All
  • AFM/SPM/SNOM
  • ARPES
  • Automated Mineralogy
  • CL
  • CLEM
  • Diffraction Imaging
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Laser spectroscopy
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Raman
  • SEM
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • WDS
  • XRF