Model 1040 NanoMill

NanoMill TEM specimen preparation system

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

  • Key Features

    • Achieve ultimate specimen quality free from amorphous and implanted layers
    • Complements FIB technology by removing damaged areas and Milling without introduction of artefacts
    • In situ imaging with ions and electrons to lacoate the lamela precisely
    • Ultra-low ion energies inert gas Low energy Ar source (50 eV to 2 kV) with sub-micron beam diameter
    • Software controlled operation Total control of all milling/polishing parameters Storage of recipes for rapid recall
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  • Manipulators & Stages