TESCAN CLARA

The only UHR-SEM in the market that doesn’t discriminate samples

Field-free analytical UHR SEM for materials characterisation at nanoscale

  • Key Features

    • TESCAN BrightBeam™ the most versatile and easy to use UHR-SEM column technology
    • Unique In-Beam BSE detector designs allow filtering of signal based on energy and take off angle
    • Powerful detection system allows acquiring up to 9 different signals
    • Largest field of view thanks to the TESCAN Unique Wide Field Optics™
    • Ideal host for more complicated application such as Cryo, SBF, CL, WDS, etc.
    • Smart and patented In-Flight Beam Tracing™ Adaptive spot shape optimisation for better performance at high currents
    • Intuitive Essence™ software modular platform designed for effortless operation regardless of the user's skill level
  • All
  • AFM/SPM/SNOM
  • CL
  • CLEM
  • Diffraction Imaging
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Micro XRF
  • Microscopy
  • Raman
  • SEM
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • WDS
  • XRF