Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

A stable heating module capable of temperatures up to 1500° C for a range of in situ SEM studies with gas capable micro-environments enabled

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

With rapid temperature changes and precise control using a PID-controller, combined with quick lock connectors for fast turn around, makes this the perfect peltier stage

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

The MM3A-LS micromanipulator is employed by scientists around the world and is renowned for long-term stability and precision and has earned Kleindiek Nanotechnik a reputation for top-of-the-line manipulation solutions.

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

World leading in situ materials testing of bending characteristics using your SEM

World leading in situ materials testing of tensile and compression characteristics using your SEM

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

The Probe Workstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.

Versatile and powerful FEG SEM

Versatile and powerful tungsten SEM

A cryo-compatible version of the Kleindiek micro-grippers that can be cooled to liquid nitrogen temperatures for in situ cryo TEM sample liftouts of site specific TEM slices prepared in cryo FIBs

A four-axis positioning tool especially designed to allow rocking a sample while observing it with both the electron and ion beams. It provides an additional tilt axis that is
perpendicular to the FIB-SEM’s stage’s tilt axis allowing for rocking of the sample back and forth on an axis that is perpendicular to the focussed ion beam