
UHV FIB-SEM NanoSpace
AFM/SPM/SNOMCLEDSElectron MicroscopyFabricationFIBSEMWDS
EBIC characterisation system for EBAC, RCI, EBIV, EBIRCH and EBIC measurements
An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM’s and FIB’s making it the ideal choice for circuit testing and probing.