Apollo Diffraction ImagingElectron MicroscopyTEM The World’s First Event-Based Camera for High-Throughput Cryo-EM with no compromise in the QE and Speed
TESCAN VEGA Compact CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.
UVEX-M Manual Imager Diffraction ImagingProtein Crystallography Manual scanning imager for macromolecule (protein, DNA and RNA) crystallography
UVEX-P Automated Imager Diffraction ImagingProtein Crystallography Programmed scanning imager for macromolecule (protein, DNA and RNA) crystallography
UVEX PS-640 Diffraction ImagingProtein Crystallography Large capacity storage cabinet for imaging and plate management
UVEX PS-256 Diffraction ImagingProtein Crystallography Temperature controlled storage cabinet for imaging and plate management
TESCAN SOLARIS X EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBMicroscopySEMTEMWDS Xe plasma FIB-SEM for Semiconductors
Alveole Primo Biological MicroscopyElectron MicroscopyProteinTEM Engineer custom microenvironments and fine-tune their mechanical and biochemical properties, at the micrometer scale
chameleon Electron MicroscopyMicroscopySEM Rapid progress to the perfect ice thickness for your cryo-EM sample
QM Quantum Microscope ARPESDiffraction ImagingLaser spectroscopy Completely configurable, the QM comprises a laser source (EUV and/or VUV), amplifier, beamline tailored to the user’s experiment, and imaging or other analysis workstations that can effectively cover the microscopy/spectroscopy landscape for nano-to-quantum materials
Eucentric Five Axis Table EDSFIBSEM The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.
Model 2550 Cryo Transfer Tomography Holder Electron MicroscopyIn situTEM Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis
Model 1070 NanoClean Electron MicroscopySEMTEM Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis
Model 1051 TEM Mill Diffraction ImagingFIBTEM Table top precision preparation for producing high quality TEM samples for a wide variety of applications
Model 1080 PicoMill Diffraction ImagingFIBTEM The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest
Model 1061 SEM Mill EBSDEDSMicro XRFSEMWDS Table top precision preparation for producing high quality SEM samples for a wide variety of applications
Heating Module In situSEM A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled
Cryo Module 80 Kelvin Electron MicroscopyFIBIn situSEM An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM
Electrostatic Beam Blanker CLSEM With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography
SEM Add-on Tools In situSEM Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM
Transfer Module Electron MicroscopyFIBIn situSEM Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.
Bending Module In situSEM World leading in situ materials testing of bending characteristics using your SEM
Anti Curtaining Table FIB A four-axis positioning tool especially designed to allow rocking a sample while observing it with both the electron and ion beams. It provides an additional tilt axis that is perpendicular to the FIB-SEM’s stage’s tilt axis allowing for rocking of the sample back and forth on an axis that is perpendicular to the focussed ion beam
DE-64 Diffraction ImagingElectron MicroscopyTEM Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.
DE-16 Diffraction ImagingElectron MicroscopyTEM The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.
DE-DirectView Diffraction ImagingElectron MicroscopyTEM With high sensitivity and excellent resolution, the DE-DirectView offers cost-effective direct detection for biological and material science applications.
Lumis EBSD Detector EBSDEDSMicro XRDSEM Rapidly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology designed for maximum throughput and high resolution. The Thermo Scientific™ Lumis EBSD detector incorporates new CMOS sensor technology and advanced optics
Quasor II™ EBSD System EBSDEDSFIBMicro XRDSEM Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterises crystalline structures which affect physical properties in a wide range of materials examined with scanning electron microscopes (SEMs) and X-ray microanalysis
TESCAN MIRA CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS Versatile and powerful FEG SEM
TESCAN UniTOM XL Computed TomographyIn situX-ray ImagingX-ray Microscopy A unique alternative in Dynamic 3D X-ray imaging for your lab
Model 1040 NanoMill Diffraction ImagingElectron MicroscopyFIBTEM The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality
TESCAN VEGA CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS Analytical SEM for materials science and life science applications in research and industry
TESCAN AMBER - Ga FIB-SEM EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography The most versatile and universal analytical Ga FIB-SEM platform on the market
TESCAN AMBER X EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography The most modern Xe plasma FIB SEM
MM3E Micromanipulator Electron MicroscopyFIBIn situSEM Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument
Tensile/Compression Module EBSDEDSIn situSEM World leading in situ materials testing of tensile and compression characteristics using your SEM
Cryo Liftout System FIBSEM A cryo-compatible version of the Kleindiek micro-grippers that can be cooled to liquid nitrogen temperatures for in situ cryo TEM sample liftouts of site specific TEM slices prepared in cryo FIBs
SuperFlat AFM AFM/SPM/SNOMIn situSEM The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ
EBIC Characterisation System In situSEM An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.
Climate In situTEM The Climate gas & heating solution enables dynamic studies of cyclic specimen transformations in gaseous environments at elevated temperatures and sub-Angstrom level.
Lightning In situTEM In Situ TEM Biasing & Heating Sample Dynamics under controlled electrical and thermal environment.
NanoWorkstation FIBIn situSEM The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.
Model 2020 Advanced Tomography Holder In situTEM A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries