Model 1062 TrionMill

Benchmark for SEM cross section and surface preparation

Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses at shortest possible time and largest possible size.

  • Fischione model 1062 trionmill - fast large area ion milling - sample preparation for SEM and TEM

    Key Features

    • Three independently adjustable TrueFocus ion sources
    • Planar sample size - up to 50 mm dia. x 25 mm height, cross section: 10 x 10 x 4 mm max.
    • Controllable beam diameter over a wide range of operating energies - 100 eV to 10 keV
    • 360° continuous rotation - with variable speed and a rocking feature
    • Automatic height detection - establishes the milling plane yielding repeatable results
    • Liquid nitrogen-cooled sample stage
    • Vacuum/inert gas/cryogenic transfer system - protects environmentally sensitive samples
    • Remote operation

The Fischione Instruments’ Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses, offering you the best chance acquiring optimal images. With 3 ion sources, the Trionmill provides rapid, large-scale milling of planar and cross-sectional surfaces (up to 50mm) while the low energy milling concurrently polishes the sample surface.

TrionMill Applications

Some of the potential applications of the Model 1062 TrionMill include:

  • Metals and alloys
  • Semiconductors
  • Geological materials and minerals
  • Fischione Model 1062 Trionmill – Overview

    This video offers a comprehensive system overview including features, capabilities, operation, system options including sample transfer module, in situ viewing, in situ imaging and remote operation, as well as applications.

  • All
  • AFM/SPM/SNOM
  • ARPES
  • CL
  • CLEM
  • Diffraction Imaging
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Laser spectroscopy
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Raman
  • SEM
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • WDS