Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Xe plasma FIB-SEM for Semiconductors

Rapid progress to the perfect ice thickness for your cryo-EM sample

SPARC: High-performance SEM cathodoluminescence detector

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

World leading in situ materials testing of bending characteristics using your SEM

Rapidly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology designed for maximum throughput and high resolution. The Thermo Scientific™ Lumis EBSD detector incorporates new CMOS sensor technology and advanced optics

Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterises crystalline structures which affect physical properties in a wide range of materials examined with scanning electron microscopes (SEMs) and X-ray microanalysis

Versatile and powerful FEG SEM

Panchromatic and RGB Cathodoluminescence (CL) detector

Analytical SEM for materials science and life science applications in research and industry

The most versatile and universal analytical Ga FIB-SEM platform on the market

The most modern Xe plasma FIB SEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

World leading in situ materials testing of tensile and compression characteristics using your SEM

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.