Bending Module

World class materials testing capabilities

World leading in-situ materials testing of bending characteristics using your SEM.

  • Key Features

    • Outstanding load ranges. With load ranges from 0 ... 0.2... up to 200N observations of surface changes under controlled mechanical load is achievable across a wide range of materials. 5kN variants are also available
    • Flexibility. The bending module allows for viewing of the specimen's top and side. This is achieved even while the specimen is still the device without changing the applied load, allowing different viewing directions within a single experiment.
    • Versatile. Along with compatibility to almost every SEM on the market the bending module is capable of being used in stand alone atomic force microscopes (AFM's) and scanning acoustic microscopes (SAM's).
    • Multiple configurations. The bending module comes with both 3 and 4 point bending configurations
  • All
  • AFM/SPM/SNOM
  • CL
  • CLEM
  • Computed Tomography
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Raman
  • SEM
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • WDS
  • X-ray Imaging
  • X-ray Microscopy