
TESCAN AMBER X
Ultra-high resolution Xe Plasma FIB-SEM

TESCAN AMBER X is the most versatile and universal analytical Xe plasma FIB-SEM platform in the market
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Key Features
- NEW iFIB+™ Xe plasma FIB column 2 μA probe current, Fast and precise piezo-driven beam aperture change and gun alignment
- Newly designed BrightBeam™ UHR SEM column technology Field-free ultra-high resolution SEM column for maximum versatility in sample analysis
- Next generation Essence™ SW user interface Application-oriented, fully customisable and user-friendly layout
- FIB Field of view Unmatched Field of View: 1 mm at 30 keV
- New detection system Optimized in-beam detection system with improved detection efficiency and energy-filtering detection capabilities
- Smart and patented In-Flight Beam Tracing™ Adaptive spot shape optimization for better performance at high currents
- EquiPower™ lens technology for efficient thermal power dissipation and excellent electron column stability

Analysis of Flexible OLEDs using an Xe plasma FIB-SEM
- All
- Additive Manufacturing
- AFM/SPM/SNOM
- ARPES
- Automated Mineralogy
- Biological Microscopy
- Bioprinting
- CL
- CLEM
- Computed Tomography
- Computed Tomography - Life Sci
- Diffraction Imaging
- Digital Microscopy
- EBSD
- EDS
- Electron Beam Lithography (EBL)
- Electron Microscopy
- Fabrication
- FIB
- Fluorescent Microscopy
- Hyperspectral
- In situ
- Laser spectroscopy
- LIBS
- Light Microscopy
- Micro XRF
- Microscopy
- Radiography
- Raman
- SEM
- Spectroscopy
- Super Resolution Microscopy
- TEM
- Thermal Probe Lithography
- WDS
- X-ray Imaging
- X-ray Microscopy