Large area EBSD sample preparation by broad ion beam milling BIB milling that offers uniform sample milling up to 50 mm in diameter.
The TESCAN UniTOM HR is the ideal microCT for core facility labs combining speed, resolution, performance, versatility & dynamic CT.
Semiconductor device delayering by broad argon ion beam milling [TrionMill, Fischione Instruments] offers effective milling area of 50mm
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Learn how hybrid photon counting detectors work as well as their advantages over older detector technologies, using examples and case studies.
When it comes to speed and resolution, 2 photon polymerisation (2PP) technology stands head and shoulders above other 3D printing technologies.
Benchtop NMRs perform many of the analytical tasks normally carried out using high field (superconducting) instruments.
Being able to perform probing and manipulation at the nanoscale in situ within your SEM can open up new araes of research & characterisation.
On-demand webinar – Dynamic 4D Computed Tomography in Materials Engineering