Monitoring Strain Localisation During Deformation in Alloys – A New in situ Capability
Monitoring Strain Localisation During Deformation in Alloys – A New in situ Capability
WEBINAR – Correlative Probe & Electron Microscopy using an in situ AFM-in-SEM system
On demand webinar Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) are two of the most used, complementary techniques for surface analysis at the nanoscale. Combining them by integrating a compact AFM LiteScope™ into an SEM brings novel ...
X-Ray Diffraction for Materials Science
X-ray diffraction (XRD) is a staple tool for materials identification in materials science. It is commonly used to determine the phase assemblage of crystalline materials, i.e. for materials like Silica ...
XPS – X-Ray Photoelectron Spectroscopy for Surface Characterisation
XPS or X-ray photoelectron spectroscopy is the most broadly applicable analytical technique used to characterise surfaces
Dynamic Micro-CT Imaging Solutions from TESCAN
Dynamic Micro-CT takes Computed Tomography to the Next Dimension – 4D
ToF-SIMS Time of Flight Secondary Ion Mass Spectrometry Using a FIB-SEM
On-Demand Webinar This webinar presented by Dr. Will Rickard form Curtin University covers the theory and applications of FIB-SEM based ToF-SIMS. ToF-SIMS is a recently developed technique that provides elemental ...
Cicadas Inspire EBL Titanium Nanopillars for Antibacterial Effect
By Dr. Hesam Shahali1, Dr. Cameron Chai2, Dr. Kamran Khajehpour2 and Prof. Prasad KDV Yarlagadda OAM1 From spider’s silk which exhibits strength 3 time greater than aramid fibres and 5 ...
Correlative Probe and Electron Microscopy – CPEM – AFM inside your SEM Chamber
SEM has been a pillar for scientific research for many years revealing structural details about materials, organisms and systems that would otherwise remain invisible. Modern systems produce ultra-high-resolution 2D images ...
Celeritas – 4D STEM Camera On-Demand Webinar
Learn about the benfits and applications of Celeritas Celeritas is Direct Electron’s new 4D STEM camera. 4D STEM is a cutting-edge technique that uses the richness of information available in ...
Computed Tomography Solutions for All Applications
AXT offers a wide range of Computed Tomography solutions including turnkey systems from Yxlon, TESCAN, Rigaku and Sigray or we can build bespoke system to suit your exacting requirements.