Gallium FIB-SEMs (Focussed ion Beam-Scanning Electron Microscope) have been and continue to be valuable instruments in materials researchers’ arsenals. However, more recent variants like the TESCAN AMBER X, Xe plasma ...

SEMs and TEMs are commonplace in materials research providing high resolution insights into micro and nanostructures. While additional detectors can provide chemical analysis etc., electron microscopes have traditionally been restricted ...