Compositional Analysis and Microscopy with X-ray Fluorescence Technology Complementary to Synchrotron Performance

Redefining µ-XRF with the world’s first X-ray Fluorescence Microscope, enabled by Sigray Patented Technology

  • Key Features

    • Highest resolution x-ray fluorescence mcroscope spatial resolution down to 5 μm
    • Highest throughput x-ray fluorescence microscope down to 5 ms/point
    • Unprecedented PPB sensitivity within 1 second, up to orders of magnitude higher in sensitivity than alternative techniques such as SEM-EDS
    • High brightness x-ray source 50X brightness of microfocus sources used in conventional μXRFs
    • Easy to use and powerfully precise simultaneous detection of multiple elements and no sample preparation required
    • Fine Anode Array Source Technology (FAAST) Sigray's unique multi-target source provides easy software-selection of target materials to ensure the ultimate sensitivity for each element
    • Patented Trace Mineralogy Technique Femtogram and < 1ppm sensitivity for trace elements. Orders of magnitutde higher sensitivity than SEM-EDS
    • GeoFocused edition provides chemical mapping mining, geochronology, exploration with simultaneous acqutistion
    • Patented Multi Energy Approach maximise element sensitivity using a push button change of source and optic