The Explore has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features combined with an integrated direct laser writer option for large feature patterning

A bench top source for EUV and soft X-rays

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC: High-performance SEM cathodoluminescence detector

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Highly Customisable digital microscope for 2D and 3D examination and analysis of samples from 0x to 10,000x magnification

Versatile and powerful FEG SEM

Panchromatic and RGB Cathodoluminescence (CL) detector

Versatile and powerful tungsten SEM

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

The Scholar has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features in a bench top design

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

The Probe Workstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.