Correlative AFM and SEM

  • NenoVision are a technology company that was spun out of Brno University of Technology and the Central European Institute of Technology (CEITEC). They develop, manufacture and sell a revolutionary type of atomic force microscope (AFM) LiteScope™ designed for fast and easy integration into scanning electron microscopes (SEMs).

    The advantage to in situ AFM-in-SEM (or Correlative Probe and Electron Microscopy, CPEM) is that it enables the user to combine datasets of both techniques and to simultaneously correlate the two-dimensional images from SEM with three-dimensional images from AFM resulting in a more comprehensive analysis.