Battery & Energy

Advanced technology to assist research in battery and energy storage development

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All
AFM/SPM/SNOM
ARPES
Biological Microscopy
CL
Computed Tomography
Core Scanning
EDS
Fabrication
FIB
In situ
LIBS
Micro XRD
Micro XRF
Microscopy
Powder
Raman
Sample Preparation
SAXS/WAXS
SEM
TEM
Thermal Probe Lithography
Thin Film
WDS
X-ray absorption spectroscopy (XANES/EXAFS)
X-ray Imaging
X-ray Microscopy
XPS/UPS/Auger
XRD
XRF

TESCAN SOLARIS X

TESCAN SOLARIS X

EDSFabricationFIBMicroscopySEMTEMWDS

Solaris X
Xe plasma FIB-SEM for Semiconductors

QuantumLeap XAS

QuantumLeap XAS

X-ray absorption spectroscopy (XANES/EXAFS)

X-ray Absorption Spectroscopy (XAS)

NEXSA

NEXSA

ARPESRamanX-ray absorption spectroscopy (XANES/EXAFS)XPS/UPS/Auger

Nexsa X-Ray Photoelectron Spectrometer (XPS) System

Ntegra

Ntegra

AFM/SPM/SNOM

NTEGRA is a multi-functional device capable of performing more than 40 measuring methods This versatility allows analysis of physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment.

NanoFrazor Explore

NanoFrazor Explore

FabricationThermal Probe Lithography

The NanoFrazor Explore has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features combined with an integrated direct laser writer option for large feature patterning

AttoMap

AttoMap

EDSMicro XRFWDSXRF

High resolution micro-XRF

FF35 CT

FF35 CT

Computed TomographyX-ray ImagingX-ray Microscopy

High resolution industrial CT system for small/medium sized parts inspection

FF20 CT

FF20 CT

Computed TomographyX-ray ImagingX-ray Microscopy

Ultimate automated semiconductor analysis

Rod Crusher

Rod Crusher

Sample Preparation

Contactless crushing of high purity products with less than parts per trillion levels of introduced contamination

Model 2550 Cryo Transfer Tomography Holder

Model 2550 Cryo Transfer Tomography Holder

In situTEM

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

FIBIn situSEM

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Transfer Module

Transfer Module

FIBIn situSEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Solver Nano

Solver Nano

AFM/SPM/SNOM

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.

NEXT II

NEXT II

AFM/SPM/SNOMBiological Microscopy

NEXT II provides motorised sample positioning and integrated high resolution optical microscope positioning, motorised continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorisation. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution.

TESCAN MIRA

TESCAN MIRA

CLEDSIn situMicro XRFSEMWDS

Versatile and powerful FEG SEM

TESCAN UniTOM XL

TESCAN UniTOM XL

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A unique alternative in Dynamic 3D X-ray imaging for your lab

TESCAN VEGA

TESCAN VEGA

CLEDSIn situMicro XRFSEMWDS

Versatile and powerful tungsten SEM

MiniFlex 6G

MiniFlex 6G

PowderXRD

The Leading Light of Benchtop X-ray Diffractometery

TESCAN AMBER

TESCAN AMBER

EDSFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

TESCAN AMBER X; the most versatile and universal analytical Xe plasma FIB-SEM platform in the market

TESCAN AMBER X

TESCAN AMBER X

EDSFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

TESCAN AMBER X - the most modern Xe plasma FIB SEM

NANOPIX mini

NANOPIX mini

SAXS/WAXSXRD

The world's first benchtop SAXS instrument

NANOPIX

NANOPIX

PowderSAXS/WAXSThin FilmXRD

Synchrotron level SAXS performance at your fingertips

SmartLab

SmartLab

Micro XRDPowderSAXS/WAXSThin FilmXRD

The pinnacle instrument for X-ray materials analysis

Lab

Lab

Sample Preparation

Selective fragmentation for liberating material along their grain boundaries

MISSION:CORIOSITY

MISSION:CORIOSITY

Core ScanningLIBS

High speed LIBS
High resolution geological core analysis for elemental maps and mineral images

NanoFrazor Scholar

NanoFrazor Scholar

FabricationThermal Probe Lithography

The NanoFrazor Scholar has the ability to perform 3D patterning, in situ inspection, markerless overlay and high resolution Closed-Loop Lithography on nano-sized features in a bench top design

Cheetah EVO 2D/3D Inspection System

Cheetah EVO 2D/3D Inspection System

Computed TomographyX-ray Imaging

The Cheetah EVO Plus includes new and improved features that make the system ready for the paradigm shift to a smart factory

Cougar EVO Series

Cougar EVO Series

Computed TomographyX-ray ImagingX-ray Microscopy

Scalable small footprint X-ray inspection systems for electronic componentry, and medical/military devices

MU2000-D

MU2000-D

Computed TomographyX-ray Imaging

YXLON MU2000-D is a robust, reliable X-ray and CT inspection system for industrial and academic applications

Z-200 & Z-200C+ LIBS Handheld Analysers

Z-200 & Z-200C+ LIBS Handheld Analysers

LIBS

The only handheld analyser that accurately measures carbon content in metals and other materials

MM3E Micromanipulator

MM3E Micromanipulator

FIBIn situSEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Climate

Climate

In situTEM

The Climate gas & heating solution enables dynamic studies of cyclic specimen transformations in gaseous environments at elevated temperatures and sub-Angstrom level.

Wildfire

Wildfire

In situTEM

Wildfire In situ TEM Heating

Lightning

Lightning

In situTEM

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

Stream

Stream

In situTEM

STREAM; In Situ TEM Liquid, Liquid Biasing and Liquid Heating

NanoWorkstation

NanoWorkstation

FIBIn situSEM

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

Model 2020 Advanced Tomography Holder

Model 2020 Advanced Tomography Holder

In situTEM

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries

All
SAXS/WAXS
Thin Film
XRD

Particle Size And Shape

Particle Size And Shape

SAXS/WAXSXRD

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Thin FilmXRD

TESCAN Orsay Holding

TESCAN Orsay Holding

Sigray

Sigray

Thermo Scientific

Thermo Scientific

NT-MDT

NT-MDT

Heidelberg Instruments Nano

Heidelberg Instruments Nano

YXLON

YXLON

SELFRAG

SELFRAG

Fischione Instruments

Fischione Instruments

Kammrath & Weiss

Kammrath & Weiss

Rigaku

Rigaku

ELEMISSION

ELEMISSION

SciAps

SciAps

Kleindiek Nanotechnik

Kleindiek Nanotechnik

DENSsolutions

DENSsolutions