A STEM that is as easy to use as a SEM

The world's first sub-micron 600nm dynamic micro-CT allowing true 4D scanning with a temporal resolution of 5 seconds.

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

Ultimate UHR-SEM with TESCAN TriLens™ immersion optics technology

The only UHR-SEM on the market that doesn’t discriminate between samples

Highest quality TEM lamellae preparation and superior analytical performance

Xe plasma FIB-SEM for Semiconductors

A dedicated 4D X-ray imaging

Versatile and powerful FEG SEM

Multiscale 3D core imaging

A unique alternative in Dynamic 3D X-ray imaging for your lab

Analytical SEM for materials science and life science applications in research and industry

The most versatile and universal analytical Ga FIB-SEM platform on the market

The most modern Xe plasma FIB SEM

The TIMA is the most advanced Automated Mineralogy system

Ultra-Fast Large Area Biological Imaging

METEOR is the world’s first and only fully integrated solution to optimise the cryo-ET workflow by reducing complicated transfer steps and increasing sample yield

SPARC: High-performance SEM cathodoluminescence detector

Panchromatic and RGB Cathodoluminescence (CL) detector

SECOM SR : Fully integrated correlative super-resolution (SR) optical microscopy in combination with an electron microscope.

In Situ TEM Cooling, Biasing & Heating for your TEM

Prepare lamellae directly on your Nano-chip inside your FIB

The Climate gas & heating solution enables dynamic studies of cyclic specimen transformations in gaseous environments at elevated temperatures and sub-Angstrom level.

Wildfire In situ TEM Heating

In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment.

STREAM; In Situ TEM Liquid, Liquid Biasing and Liquid Heating

A revolutionary new direct detection camera for four-dimensional scanning transmission electron microscopy (4D STEM) delivering more speed, more pixels and exceptional image quality.

The world’s first event-based camera for high-throughput cryo-EM with no compromise in the QE and speed

Ideal for cryo-EM of very large viruses or cellular tomography. The DE-64 delivers user-adjustable full-frame streaming at up to 46 frames per second and offers unparalleled performance for electron counting.

The DE-16 features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor, delivering industry-leading resolution and flexible, seamless viewing on a 4k x 4k field-of-view. The DE-16 is our most versatile direct detection TEM camera that enables TEM experiments not previously possible on a direct detector.

Excellent upgrade option for your existing TEM offering low dose imaging, electron counting and 4D STEM

Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses at shortest possible time and largest possible size.

An ideal platform to protect environmentally sensitive material during transfer to TEM’s

Cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low dose imaging and analysis

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Table top precision preparation for producing high quality TEM samples for a wide variety of applications

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

The NanoMill system is the ultimate companion for your FIB to optimise TEM specimen preparation quality

A revolutionary holder that allows room temperature data collection over wide tilt and translation ranges, even in restrictive pole-piece gap geometries

Metrology module for Hirox Digital Microscope – a complete inspection and measurement solution

Bringing digital microscopy to a completely new level

Highly Customisable digital microscope for 2D and 3D examination and analysis of samples from 0x to 10,000x magnification

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

With rapid temperature changes and precise control using a PID-controller, combined with quick lock connectors for fast turn around, makes this the perfect peltier stage

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

World leading in situ materials testing of bending characteristics using your SEM

World leading in situ materials testing of tensile and compression characteristics using your SEM

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

A four-axis positioning tool especially designed to allow rocking a sample while observing it with both the electron and ion beams. It provides an additional tilt axis that is
perpendicular to the FIB-SEM’s stage’s tilt axis allowing for rocking of the sample back and forth on an axis that is perpendicular to the focussed ion beam

The MM3A-LS micromanipulator is employed by scientists around the world and is renowned for long-term stability and precision and has earned Kleindiek Nanotechnik a reputation for top-of-the-line manipulation solutions.

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

A cryo-compatible version of the Kleindiek micro-grippers that can be cooled to liquid nitrogen temperatures for in situ cryo TEM sample liftouts of site specific TEM slices prepared in cryo FIBs

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

The ProbeWorkstation is a powerful, dedicated system for electrical characterisation of semiconductor devices and advanced materials in SEM and FIB. The optimal combination of our market-leading nano-manipulation and probing products provide a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.

Correlative in situ AFM and SEM

A versatile platform ideally suited to FIB-SEM applications in an UHV and contamination free environment