LVEM 5 Benchtop Low Voltage TEM

LVEM 5 Benchtop Low Voltage TEM

The LVEM 5 is a highly versatile and powerful imaging system in an extremely compact package & is the only benchtop TEM available.

  • Delong Instruments - benchtop low voltage TEM

    Key Features

    • 5 kV benchtop TEM
    • Nanometer resolution - Down to 1.2nm / 4nm (SEM) / 2.5nm (STEM)
    • Compact - Can be easily installed in virtually any lab or cleanroom
    • Simple installation - No special facilities required - e.g. dedicated room, anti-vibration isolation, power supply or cooling
    • FEG source - High brightness and spatial coherency → high contrast
    • Permanent magnet lenses - Simplifies design and reduces size
    • 4 in 1 design - TEM, SEM, STEM & ED
    • Motorised stage & joystick control - Intuitive sample manipulation
    • 90% smaller than conventional TEMs - With comparable if not better performance
    • Simple to use - Making TEM available for any lab
    • Low cost of ownership

The LVEM 5 is a highly versatile and powerful imaging system in an extremely compact package and is the only benchtop TEM currently available. Depending on the configuration it can alternate between TEM, SEM, STEM and ED modes without needing to realign the column or adjust the sample. This versatility combined with small form factor allow you to have your imaging exactly where you need it for maximum efficiency.

The miniturised design and ease-of-use of Delong’s benchtop TEMs makes TEM imaging and analysis a real possibility for any lab. The operation is so simple with no need for routine operations such as beam alignment and as such there is no need for an experienced TEM operator. Furthermore, the unique design requires virtually no ongoing maintenance.

Multiple EM Modes in the Same Instrument


The unique design of Delong’s instruments incorporates TEM, SEM and STEM into one instrument. This allows you to glean complimentary data sets from the same sample i.e.:

  • Topography/elemental surface contrast (SEM)
  • Amplitude/phase transmission (TEM/STEM)

While the low voltage design enables surface and transmission imaging i.e. TEM and SEM/STEM on the same instrument on the same region of interest. Furthermore, the lower accelerating voltage provides higher contrast in low Z samples.

Life Science Benefits from Low Voltage


The advantage of low accelerating voltage in life sciences and biology is it eliminates the need for staining so you can visualise proteins and other low Z materials in their natural state i.e. no need for using heavy metals and other toxic agents

Low Cost of Ownership


With low establishment costs and virtually no preventative maintenance and servicing needs, the LVEM 5 is extremely cheap to maintain. In fact, the purchase of one of these systems can be cheaper than ongoing maintenance of older instruments.

Ideal for particulate materials

Can save time by using this as a pre-screening instrument before sending to HR-TEM or core imaging facilities

Specific sample holders

  • Tilt holder – +-22.5° rotation (45° total) and compatible with SEM and TEM
  • AFM tip holder – Max. substrate size 4.0 x 2.5 x 0.45mm and compatible with SEM and TEM

Applications


Some examples of where the LVEM 5 can be used include:

Materials Science

  • Nanomaterials
  • Polymer sciences
  • 2D materials
  • Nanofibers
  • Quantum dots
  • Asbestos

Life Science

  • DNA Origami
  • Nanomedicine
  • Biologic thin sections
  • Virology
  • Pathology
  • LVEM 5 Product Overview

    Run time – 1:00 min

    This short video provides a quick overview of the LVEM 5’s capabilities and applications.

  • Nanoparticles imaged using the Delong Instruments LVEM5 benchtop TEM

    Nanoparticle Imaging

    A range of nanoparticles images using the Delong Instruments LVEM5 benchtop TEM that clearly demonstrate nanometre resolving power.

  • All
  • AFM/SPM/SNOM
  • CL
  • CLEM
  • Diffraction Imaging
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Micro XRF
  • Microscopy
  • Raman
  • SEM
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • WDS