Electronics

Specialised inspection and CT systems for advanced electronic applications

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All
ARPES
Biological Microscopy
CL
CLEM
Computed Tomography
Digital Microscopy
EBSD
EDS
Electron Beam Lithography (EBL)
Fabrication
FIB
Hyperspectral
In situ
LIBS
Light Microscopy
Micro XRD
Micro XRF
Microscopy
Powder
Protein Crystallography
Radiography
Raman
SAXS/WAXS
SEM
Super Resolution Microscopy
TEM
Thermal Probe Lithography
Thin Film
WDS
X-ray absorption spectroscopy (XANES/EXAFS)
X-ray Imaging
X-ray Microscopy
XPS/UPS/Auger
XRD

VGSTUDIO MAX

Computed Tomography

High-end software for the analysis and visualisation of CT data

SmartLab

Micro XRDPowderSAXS/WAXSThin FilmXRD

The pinnacle instrument for X-ray materials analysis

TESCAN VEGA Compact

CLCLEMEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

CT Lab HX130

Computed Tomography

Benchtop ergonomics Computed Tomography for materials science

TESCAN SOLARIS X

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBMicroscopySEMTEMWDS

Xe plasma FIB-SEM for Semiconductors

COBRA

LIBS

MISSION:COBRA Process optimisation with the Continuous On Belt Real time Analysis of minerals and chemistry

Nexsa G2

ARPESRamanX-ray absorption spectroscopy (XANES/EXAFS)XPS/UPS/Auger

Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System

AttoMap

Micro XRF

The Most Advanced XRF Microscope Assembled for a Homelab

SPARC

CLHyperspectralRamanSEM

SPARC: High-performance SEM cathodoluminescence detector

FF35 CT

Computed TomographyX-ray ImagingX-ray Microscopy

High resolution industrial CT system for small/medium sized parts inspection

FF20 CT

Computed TomographyX-ray ImagingX-ray Microscopy

Ultimate automated semiconductor analysis

TESCAN DynaTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A dedicated 4D X-ray imaging

XRTmicron

Thin FilmXRD

X-ray topography imaging system, for the non-destructive evaluation of single-crystalline materials.

RH-2000

Biological MicroscopyDigital MicroscopyLight MicroscopyMicroscopy

Highly Customisable digital microscope for 2D and 3D examination and analysis of samples from 0x to 10,000x magnification

TESCAN MIRA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Versatile and powerful FEG SEM

TESCAN CoreTOM

Computed TomographyIn situX-ray ImagingX-ray Microscopy

Multiscale 3D core imaging

TESCAN UniTOM XL

Computed TomographyIn situX-ray ImagingX-ray Microscopy

A unique alternative in Dynamic 3D X-ray imaging for your lab

TESCAN VEGA

CLCLEMEBSDEDSElectron Beam Lithography (EBL)In situMicro XRFSEMWDS

Analytical SEM for materials science and life science applications in research and industry

TESCAN AMBER - Ga FIB-SEM

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

The most versatile and universal analytical Ga FIB-SEM platform on the market

TESCAN AMBER X

EBSDEDSElectron Beam Lithography (EBL)FabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

The most modern Xe plasma FIB SEM

NANOPIX

PowderProtein CrystallographySAXS/WAXSThin FilmXRD

Synchrotron level SAXS performance at your fingertips

SMART EVO & SMART XPO Accessories

RadiographyX-ray Imaging

Tube head stands and other accessories for YXLON radiographic systems

Cheetah EVO 2D/3D Inspection System

Computed TomographyRadiographyX-ray Imaging

The Cheetah EVO Plus includes new and improved features that make the system ready for the paradigm shift to a smart factory

Cougar EVO Series

Computed TomographyRadiographyX-ray ImagingX-ray Microscopy

Scalable small footprint X-ray inspection systems for electronic componentry, and medical/military devices

MU2000-D

Computed TomographyRadiographyX-ray Imaging

YXLON MU2000-D is a robust, reliable X-ray and CT inspection system for industrial and academic applications

Z-200 & Z-200C+ Handheld LIBS Analysers

LIBS

The only handheld analyser that accurately measures carbon content in metals and other materials

NANORO M

Light MicroscopyMicroscopySuper Resolution Microscopy

Nanoro M- Super Resolution Optical Microscopy

All
FIB
LIBS
Micro XRF
Microscopy
SAXS/WAXS
SEM
Thin Film
XPS/UPS/Auger
XRD

Dopant and Thin Film Analysis at Sub-Å Equivalent Thickness

Micro XRF

Analysis of Flexible OLEDs using an Xe plasma FIB-SEM

FIBMicroscopySEM

Particle Size And Shape

SAXS/WAXSXRD

Crystal defect analysis of a single crystal substrate by X-ray reflection topography

Thin FilmXRD

Carbon Analysis in Low-Alloy and Carbon Steels with Handheld LIBS

LIBS

XPS/UPS/Auger

Electronics

VGSTUDIO MAX

SmartLab

TESCAN VEGA Compact

CT Lab HX130

TESCAN SOLARIS X

COBRA

Nexsa G2

AttoMap

SPARC

FF35 CT

FF20 CT

TESCAN DynaTOM

XRTmicron

RH-2000

TESCAN MIRA

TESCAN CoreTOM

TESCAN UniTOM XL

TESCAN VEGA

TESCAN AMBER - Ga FIB-SEM

TESCAN AMBER X

NANOPIX

SMART EVO & SMART XPO Accessories

Cheetah EVO 2D/3D Inspection System

Cougar EVO Series

MU2000-D

Z-200 & Z-200C+ Handheld LIBS Analysers

NANORO M

Volume Graphics

Rigaku

TESCAN Orsay Holding

ELEMISSION

Thermo Scientific

SIGRAY

Delmic

YXLON

Hirox

YXLON Portables

SciAps

Nanoro