ToF-SIMS Time of Flight Secondary Ion Mass Spectrometry Using a FIB-SEM

On-Demand Webinar

This webinar presented by Dr. Will Rickard form Curtin University covers the theory and applications of FIB-SEM based ToF-SIMS. ToF-SIMS is a recently developed technique that provides elemental analyses like EDS and WDS, but goes further and is able to also generate chemical state and molecular information. The system used here is a TESCAN LYRA Ga FIB-SEM.

Will Rickard Curtin University TESCAN LYRA Ga FIB-SEM with Time of FLight Secondary Ion Mass Spectrometry