TESCAN VEGA Compact
Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.
Exploring the chemistry of tuff laminae to understand volcanoes’ eruption history.
Analysis of Trace Elemental Distribution in Plant Specimens
In crop sciences, genetic modification of crops to improve uptake of trace elements such as Cu, Fe, and Zn is a major focus of research, because it has direct implications ...
Dopant and Thin Film Analysis at Sub-Å Equivalent Thickness
We describe a new technique for non-destructive, quantitative measurements of dopants with equivalent thicknesses below 1 Angstrom and high-fidelity measurements of thin films, and with spatial resolutions of 10 μm. ...
Geo Focused AttoMap With the Sigray Patented Trace Mineralogy Technique
Mineralogy for Mining & Oil and Gas
Measurements and elemental imaging to determine co-location of trace-level minerals and rare earth elements at ppm-scale is possible at microns-scale
AttoMap
Redefining µ-XRF with the world’s first X-ray Fluorescence Microscope, enabled by Sigray Patented Technology
Model 1061 SEM Mill
Table top precision preparation for producing high quality SEM samples for a wide variety of applications
TESCAN MIRA
World’s most versatile and powerful analytical FEG SEM for both high and low-vacuum operations
XCITE™ X-Ray Source
Synchrotron Performance micro-beam X-ray source with unique multi-target capability and optics
TESCAN VEGA
World’s most versatile and powerful tungsten SEM for both high- and low-vacuum operations