TESCAN VEGA Compact
Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.
SEM and EBSD analysis of the grain structure after ECAP process of the aluminium material
Introduction The excellent casting properties of aluminum in combination with easy availability makes aluminum one of the most widely used metals in the world. The combination of light weight and ...
TESCAN SOLARIS X – Xe Plasma FIB-SEM for Semiconductors
An Xe Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis.
Model 1061 SEM Mill
Table top precision preparation for producing high quality SEM samples for a wide variety of applications
TESCAN MIRA
World’s most versatile and powerful analytical FEG SEM for both high and low-vacuum operations
3D EBSD Static Method of 3DEBSD Analysis of Ti64
3D EBSD Static Method of 3DEBSD Analysis of Ti64
TESCAN VEGA
World’s most versatile and powerful tungsten SEM for both high- and low-vacuum operations
TESCAN AMBER 2 – Ga FIB-SEM
TESCAN AMBER 2 is the most versatile and universal analytical Ga FIB-SEM platform in the market
TESCAN AMBER X 2 – Plasma FIB-SEM
Combining the speed of a plasma FIB with the resolution of a Ga FIB
Tensile/Compression Module
World leading in situ materials testing of tensile and compression characteristics using your SEM.