Technique: CL

UHV FIB-SEM NanoSpace

UHV FIB-SEM NanoSpace

A specially designed platform combining UHV required applications such as MBE, ToF SIMS etc … with the resolution power of a SEM & FIB

TESCAN VEGA Compact

TESCAN VEGA Compact

Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.

SPARC

SPARC

The SPARC is a high-performance cathodoluminescence detector, which is unique for its modular design, ease-of-use, multiple imaging modes and the ability to be retrofitted on any scanning electron microscope (SEM).

Electrostatic Beam Blanker

Electrostatic Beam Blanker

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

TESCAN MIRA

TESCAN MIRA

World’s most versatile and powerful analytical FEG SEM for both high and low-vacuum operations

TESCAN VEGA

TESCAN VEGA

World’s most versatile and powerful tungsten SEM for both high- and low-vacuum operations