UHV FIB-SEM NanoSpace
A specially designed platform combining UHV required applications such as MBE, ToF SIMS etc … with the resolution power of a SEM & FIB
TESCAN VEGA Compact
Competitively priced, the TESCAN VEGA Compact is the ideal SEM for routine analysis in industrial labs or a teaching/imaging workhorse in microscopy facilities.
Examination of the Fluorine K Line with EDS and WDS
Introduction From time to time when analyzing an iron rich material, an analyst may see the peak identification include fluorine (F) even though that element is not likely to be ...
Quantitative WDS Analysis of a Contact Metamorphosed Calc-Silicate Rock
Introduction Rocks are not simple materials but are an agglomeration of different chemical compounds or minerals. The formation mechanism and environment can determine the type, shape and distribution of minerals ...
Spatial Resolution in WDS
The use of field emission scanning electron microscopes (FESEMs) to analyse submicron-sized defects and particles has become common. These microscopes typically operate at less than 10 kV accelerating voltage and ...
TESCAN SOLARIS X – Xe Plasma FIB-SEM for Semiconductors
An Xe Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis.
Model 1061 SEM Mill
Table top precision preparation for producing high quality SEM samples for a wide variety of applications
TESCAN MIRA
World’s most versatile and powerful analytical FEG SEM for both high and low-vacuum operations
TESCAN VEGA
World’s most versatile and powerful tungsten SEM for both high- and low-vacuum operations