While TEM has been an extremely important imaging modality, it has traditionally been a difficult technique to use and access. Systems have been large, expensive and complicated to use- requiring highly specialised operators. The introduction of low-kV TEMs has overcome these issues by reducing the technical barriers to acquisition and wider adoption. In addition, low-kV TEMs have brought other advantages such as higher contrast imaging and decentralisation, still offering imaging to the nanoscale. We will explore these advantages in the following sections.
Low kV TEM Platforms
Delong Instruments’ LVEM platform demonstrates how low-voltage electron microscopy can provide valuable insights for both materials science and life science applications while reducing many of the practical limitations associated with conventional TEM systems.
Advantages of Low kV TEMs
High Contrast Imaging Advantages
One of the key advantages of low-voltage TEM imaging is its naturally high contrast, particularly when examining light-element materials and biological specimens. Operating at lower accelerating voltages enhances electron interaction with the sample, making fine structural details easier to observe. This allows researchers to achieve meaningful results with reduced staining and, in some cases, to investigate samples that would otherwise be difficult to visualise using conventional approaches. Such capabilities are especially valuable for studying proteins, viruses, cell structures, polymers, hydrogels, and other low-density materials.
Infrastructure Advantages
The compact footprint, single-plug installation, and lack of special facility requirements mean that advanced TEM capabilities can now be brought directly into individual laboratories rather than relying solely on centralised microscopy facilities. Beyond image quality, LVEM systems provide substantial operational advantages. Their compact, portable design eliminates the need for dedicated TEM suites, specialised cooling systems, vibration isolation, or extensive infrastructure, allowing installation in standard laboratory environments. For research groups, this enables true instrument ownership, providing immediate access to nanoscale imaging, reducing dependence on oversubscribed core facilities, and accelerating research timelines.
Operator and Operational Advantages
User-friendly software, automated alignments, rapid sample exchange, and streamlined workflows make the system accessible to both experienced microscopists and researchers new to electron microscopy. Compared with conventional TEM platforms, LVEM systems also offer reduced running costs and simpler maintenance requirements due to their robust design and permanent magnet technology. By enabling true instrument ownership, reducing reliance on oversubscribed core facilities, and providing immediate access to nanoscale imaging, LVEM helps laboratories accelerate research, improve productivity, and maximise the value of their scientific investments.
Low kV TEM for Materials Science
In materials science, low-voltage TEM provides detailed information about nanoparticle size, morphology, crystalline structure, and sample purity. Researchers can combine high-contrast TEM imaging with electron diffraction (ED) and energy-dispersive spectroscopy (EDS) to characterise materials comprehensively within a single instrument. Applications include nanomaterials, polymers, magnetic particles, carbon dots, 2D materials, and complex material mixtures, where accurate structural and compositional information is critical for research and development.
Low kV TEM for Life Science
For biological sciences, low-voltage TEM offers significant benefits in pathology, virology, biochemistry, immunology, and oncology. The high contrast achieved at low voltages enables rapid visualiszation of viruses, proteins, thin tissue sections, and immunolabeled samples, while reduced staining requirements help preserve important structural information. STEM, TEM, SEM, EDS, and ED capabilities can be combined to provide complementary insights into both internal and external sample features.
Overview
Transmission electron microscopy (TEM) has long been one of the most powerful techniques for nanoscale imaging, yet its adoption has traditionally been limited by the size, cost, complexity, and infrastructure requirements of conventional systems. Recent advances in low-voltage TEM technology have significantly lowered these barriers, making high-quality electron microscopy more accessible to a broader range of research laboratories. By combining nanoscale imaging performance with naturally higher image contrast, simplified operation, lower ownership costs, and minimal facility requirements, low-kV TEM systems enable researchers to generate meaningful results faster and more efficiently. Delong Instruments’ LVEM platform exemplifies this new generation of electron microscopes, providing a practical and versatile solution for both materials science and life science applications while bringing the benefits of TEM directly into the laboratory environment.
Low kV TEMs
