Sigray’s Apex-XCT™ is a revolutionary 3D x-ray computed tomography (XCT) system optimised for flat samples, such as for failure analysis of advanced packages, printed circuit boards (PCBs), cell phones, pouch cell batteries, and wafers. The system achieves submicron spatial resolution within 10 minutes, even for very large flat samples.
The Apex-XCT was designed to address a well-known problem in 3D x-ray imaging approaches in which the required acquisition time exponentially increases with sample diameter. This makes tomography of large samples such as intact, uncut PCBs and 300mm wafers practically impossible. Apex-XCT uses a breakthrough patent-pending acquisition method in which the source-sample distance is minimized throughout acquisition, thus preserving high speeds that are independent of sample diameter.