Register now to attend the

Direct Detection TEM Cameras
for
Materials Science Applications

Webinar

Wednesday, November 13, 11am AEDT

11am NSW/Vic
10.30am SA
10am Qld
8am WA

Topics covered

  • Introduction to detector technology
  • The benefits of direct detectors over scintillator-coupled cameras, including high MTF, signal-to-noise, and DQE, electron counting, optimised pixel design, and hardware binning
  • DE-16 in situ: benefits of high speed and low noise.
  • DE-16 4D-STEM: examples, a hybrid approach to analysing data, rolling and global shutters.
  • DE-16 Compressive sensing: speed/sensitivity benefits in conventional STEM scans, application for in situ

Presenter: Dr. Michael Spilman, Applications Specialist at Direct Electron

Michael received his Ph.D. in Biochemistry and Molecular Genetics under the tutelage of Dr. Terje Dokland at the University of Alabama at Birmingham. Focusing on high throughput methodologies, he went on to work with Dr. Scott Stagg at Florida State University on imaging small biological macromolecules. He is broadly interested in applying novel imaging methods using direct electron detectors to bridge high resolution biological structures with real-time dynamics. At Direct Electron, Dr. Spilman delivers both on- and off-site service and support to new and existing customers, and collaborates with customers on numerous projects including single particle cryoEM, microED, and liquid cell in situ.