TESCAN S8000G – Next Generation Ga FIB-SEM

Next generation FIB-SEM combining flexibility, speed and image quality

The TESCAN S8000G is the next generation Ga FIB-SEM an first in a new family of microscopes. Designed from the ground up to meet the increasing needs of academic and industrial researchers, the S8000G benefits from a host of new technologies that ultimately result in an anlytical instrument with superb imaging contrast for characterising materials at the nanoscale and the ability to easily produce complex nanostructures, nanopatterns and TEM and microprobe samples.

New Technologies and Systems

The TESCAN S8000G marries together new systems and technologies including:

  • The novel Orage™ Ga FIB Column
  • The new BrightBeam™ SEM column
  • The newly designed OptiGIS™ gas injection system
  • A highly user-friendly user interface

New Orage Ga FIB Column

The Orage Ga FIB column employs state-of-the-art ion optics that are up to the challenge of the most demanding nanoengineering tasks. It features

  • Ultra-high resolution (<2.5nm at 30keV) – excellent performance throughout the entire range of ion beam currents and full energy range, down to 500eV.
  • World class sample preparation quality – fantastic performance at low energies for preparation of damage-free, ultra-thin TEM specimens
  • Rapid high volume milling – with FIB currents up to 100nA and SmartMill strategies milling times are reduced by 50% allowing to you perform cross-sectioning and lamellae lift-out significantly more quickly
  • Fast FIB nanotomography – revealing unique ultra-structural information about your samples
  • New OptiGIS single gas injection system – featuring fast run up time and excellent consistency with deposition and etching rates
  • Field-free SEM imaging + high FIB current – This combination allows simultaneouls milling/imaging without interuption as well as the ability to develop advanced sample preparation recipes for TEM/atom probe or FIB-SEM tomography

BrightBeam Ultra-High Resolution SEM Column

The S8000 features a newly designed UHR SEM column that marries seamlessly with the Orage FIB column providing uncompromising imaging capabilities. Key features include:

  • 70° combined electrostatic-magnetic objective lens for ultimate universatility
  • Field-free ultra-high resolution imaging – Provides maximum imaging and analysis versatility including imaging magnetic materials and live imaging/FIB milling
  • New detectors provide more information – The new In-Beam Axial detector and Multidetector for angle-selective and energy selective signal collection provide you with ultimate control of surface sensitivity and the ability to investigate sampes with different contract opening up new possibilities
  • Next generation electronics – Up to 8 live channels processed simultaneously
  • New Schottky field emission gun – Enables beam currents up to 400nA and rapid beam energy changes
  • Excellent stability – EquiPower lens technology produces efficient thermal power dissipation resulting in optimal electron column stability
  • Improved resolution at ultra-low electron beam energies – Beam Deceleration Technology (BDT) results in fantastic resolution at low and ultra-low bean energies using simultaneous SE and BSE signal detection

Application Notes

Surface Passivated Porous Gold NanoparticlesDownload button
SEM Characterisation of Group III Hetero NanostructuresDownload button
Large Area Cross-Sectioning for Failure Analysis of Advanced Packaging TechnologiesDownload button
Automated Milling of Micro Compression Pillar ArraysDownload button

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