XtaLAB PRO Series – Single Crystal Diffractometers
The XtaLAB Pro series of x-ray diffractrometers are able to cater to a variety of different applications and sample types from small molecules to metal oxide films (MOF) through to biological macromolecules.
The common component to this series of diffractometers is the Hybrid Pixel Array Detectors (HPAD), the most modern type of detector technology available. These photon counting detectors are perfectly suited to these applications and enhance the performance of single crystal diffractometers through faster data acquisition and more accurate measurement of weak data.
HPAD detectors characteristically collect data extremely quickly through their shutterless design, fast readout and high dynamic range. They also produce almost no background noise, making poorly diffracting samples easier to detect and analyse.
The standard HPAD detector used in the XtaLAB PRO series is the PILATUS 200K which has a well established reputation. It uses the same technology as is incorporated in synchrotron beamlines around the world. Their use on XtaLB PRO diffractometers ensures the best data is collected from the x-ray source of choice for a given application.
The ideal x-ray source varies depending on the actual material being examined. The XtaLAB PRO allows the use of a range of x-ray sources to suit your particular application.
The XtaLAB PRO comes standard with a Cu MicroMax-003 microfocus sealed tube source and a 3kW Mo standard sealed tube source with a SHINE (curved graphite monochromator) optic. Where a higher flux is required, two highly reliable rotating anode sources are available, the MicrMax-007 HF and the FR-X. While there is some maintenance for rotating anodes, this is far outweighed by the higher flux which allows the detection of phases only previously possible at a synchrotron.
The XtaLAB PRO series diffractometers are housed in a new, specially designed enclosure. The enclosure has been optimised for air and temperature sensitive samples. It also allows space for a microscope and dewar allowing you to identify and mount crystals in close proximity to the diffractometer. This can be the difference between generating quality data or losing a sample.
Key features of the XtaLAB PRO series diffractometers include:
- Fast data collection via true shutterless data acquisition
- Extremely low background noise makes weakly diffracting materials easier to detect
- Wide range of x-ray sources to suit a variety of applications, including microfocus sealed tube, standard sealed tube, rotating anode and dual wavelength rotating anode
- Specifically designed enclosure to control atmosphere and enable in situ sample preparation
- Kappa goniometer and optional partial chi goniometer
- Optional cryo-devices available