S8000X

Ultra-high resolution Xe Plasma FIB-SEM

TESCAN S8000X is the most versatile and universal analytical Xe plasma FIB-SEM platform in the market

  • Key Features

    • NEW iFIB+™ Xe plasma FIB column 2 μA probe current, Fast and precise piezo-driven beam aperture change and gun alignment
    • Newly designed BrightBeam™ UHR SEM column technology Field-free ultra-high resolution SEM column for maximum versatility in sample analysis
    • Next generation Essence™ SW user interface Application-oriented, fully customisable and user-fridnly layout
    • FIB Field of view Unmatched Field of View: 1 mm at 30 keV
    • New detection system Optimized in-beam detection system with improved detection efficiency and energy-filtering detection capabilities
    • Smart and patented In-Flight Beam Tracing™ Adaptive spot shape optimization for better performance at high currents
    • EquiPower™ lens technology for efficient thermal power dissipation and excellent electron column stability
  • All
  • AFM/SPM/SNOM
  • ARPES
  • Automated Mineralogy
  • Biological Microscopy
  • CL
  • CLEM
  • Computed Tomography
  • Diffraction Imaging
  • Digital Microscopy
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Laser spectroscopy
  • Light Microscopy
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Multiphoton Microscopy
  • Pre-clinical Imaging
  • Radiography
  • Raman
  • SEM
  • Spectroscopy
  • Super Resolution Microscopy
  • TEM
  • Thermal Probe Lithography
  • WDS
  • X-ray absorption spectroscopy (XANES/EXAFS)
  • X-ray Imaging
  • X-ray Microscopy
  • XRD
  • XRF