Ultra-high resolution Xe Plasma FIB-SEM

TESCAN S8000X is the most versatile and universal analytical Xe plasma FIB-SEM platform in the market

  • Key Features

    • NEW iFIB+™ Xe plasma FIB column 2 μA probe current, Fast and precise piezo-driven beam aperture change and gun alignment
    • Newly designed BrightBeam™ UHR SEM column technology Field-free ultra-high resolution SEM column for maximum versatility in sample analysis
    • Next generation Essence™ SW user interface Application-oriented, fully customisable and user-fridnly layout
    • FIB Field of view Unmatched Field of View: 1 mm at 30 keV
    • New detection system Optimized in-beam detection system with improved detection efficiency and energy-filtering detection capabilities
    • Smart and patented In-Flight Beam Tracing™ Adaptive spot shape optimization for better performance at high currents
    • EquiPower™ lens technology for efficient thermal power dissipation and excellent electron column stability