TESCAN S8000G is the most versatile and universal analytical Ga FIB-SEM platform in the market

  • Key Features

    • Novel Orage™ Ga FIB column ltra-high resolution Ga FIB column with excellent performance throughout the entire range of ion beam currents and full energy range down to 500 eV
    • Newly designed BrightBeam™ UHR SEM column technology Field-free ultra-high resolution SEM column for maximum versatility in sample analysis
    • Next generation Essence™ SW user interface Application-oriented, fully customisable and user-fridnly layout
    • New detection system Optimized in-beam detection system with improved detection efficiency and energy-filtering detection capabilities
    • Smart and patented In-Flight Beam Tracing™ Adaptive spot shape optimization for better performance at high currents
    • High FIB currents and SmartMill strategy up to 100 nA for fast large-volume milling and SmartMill strategy slash by half the time for completing your cross-sectioning and lamella lift-out processes.
    • New single gas injection system OptiGIS with fast run up time and excellent stability of the deposition/etching rate. Up to 6 OptiGIS units is possible in one instrument.
    • EquiPower™ lens technology for efficient thermal power dissipation and excellent electron column stability
  • All
  • Add-Ons
  • Consumables
  • Detectors
  • In-Situ
  • Instrument/Systems
  • Manipulators & Stages