TESCAN AMBER

TESCAN AMBER is the most versatile and universal analytical Ga FIB-SEM platform in the market

  • Key Features

    • Novel Orage™ Ga FIB column Ultra-high resolution Ga FIB column with excellent performance throughout the entire range of ion beam currents and full energy range down to 500 eV
    • Newly designed BrightBeam™ UHR SEM column technology Field-free ultra-high resolution SEM column for maximum versatility in sample analysis
    • Next generation Essence™ SW user interface Application-oriented, fully customisable and user-friendly layout
    • New detection system Optimized in-beam detection system with improved detection efficiency and energy-filtering detection capabilities
    • Smart and patented In-Flight Beam Tracing™ Adaptive spot shape optimization for better performance at high currents
    • High FIB currents and SmartMill strategy up to 100 nA for fast large-volume milling and SmartMill strategy slash by half the time for completing your cross-sectioning and lamella lift-out processes.
    • New single gas injection system OptiGIS with fast run up time and excellent stability of the deposition/etching rate. Up to 6 OptiGIS units is possible in one instrument.
    • EquiPower™ lens technology for efficient thermal power dissipation and excellent electron column stability
  • All
  • AFM/SPM/SNOM
  • ARPES
  • Automated Mineralogy
  • Biological Microscopy
  • CL
  • CLEM
  • Computed Tomography
  • Diffraction Imaging
  • Digital Microscopy
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Laser spectroscopy
  • Light Microscopy
  • Live Cell Imaging
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Multiphoton Microscopy
  • Pre-clinical Imaging
  • Quantitative Phase Imaging
  • Radiography
  • Raman
  • SEM
  • Spectroscopy
  • Super Resolution Microscopy
  • TEM
  • Thermal Probe Lithography
  • Tomographic Microscopy
  • WDS
  • X-ray absorption spectroscopy (XANES/EXAFS)
  • X-ray Imaging
  • X-ray Microscopy
  • XRD
  • XRF