ZSX Primus

High power tube below WDXRF, with closely coupled optics and a high intensity 30 micron tube window X-Ray Tube, for unsurpassed light element performance.

A powerful tube below XRF with closely coupled optics and a high intensity 30 micron tube window X-Ray Tube for world beating light element analysis. Designed for high throughput and highly reliable operation, at an affordable price, with very low cost of operation.

  • Key Features

    • 30 Micron tube window Better light element performance, 40% higher intensities for light elements can be obtained with 30μm Be window, compared with 75μm Be window.
    • "Smart Sample Loading System" (SSLS) Increases the number and type of samples on deck,
    • ZSX Guidance expert system software ZSX Guidance supports you in all aspects of XRF measurement and data analysis.
    • Micro-XRF & Mapping feature for elemental topography/distribution Micro-XRF capability and mapping for analysing complex samples.
    • Helium seal means the optics are always under vacuum Increased reliability

Exceptional Performance

The ZSX Primus  WDXRF spectrometer features a 30μm window tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. 40% higher intensities for light elements can be obtained with this window, compared with 75μm Be window.  It has been shown to have the no loss of tube life for the enhanced performance of light elements and additionally outperformed competitor instruments in stability trials.

Exceptional Reliability

The ZSX Primus  features an innovative optics-below configuration, with a He seal meaning the optics are always under vacuum, and the sample chamber is only ever under He lowering consumption and providing a much quicker sample change over time.  With its dual pump vacuum system, the goniometer chamber is always maintained under a constant vacuum. Samples may be loaded and pumped down while another is being analysed. This dramatically increase sample throughput while keeping the optics under a constant vacuum. Automatic cleaning of the proportional counter detector centre wire ensures consistent performance.

Exceptional Flexibility in Sample Handling

The optional Smart Sample Loading System (SSLS), increases the number and types of samples on deck.
The maximum number of samples that can be loaded  has been increased from 48 to 104 units (when ∅35mm sample trays are used) Flexible combination of sample trays are selectable. It is possible to combine various sample trays  in various combinations with a simple software operation for deck configuration. Automated analysis interface provided. By communicating with the automated analytical system control computer, the sample set at the sample transfer position is measured automatically. Significantly reduces labor requirements and improves accuracy With integrated (optional) barcode reader , labor requirements are reduced and data transcription accuracy increased.



  • Key Features:
    The ZSX Primus XRF will analysis all elements from Be to U. This is made easy with the ZSX Guidance expert system and EZ Analysis interface for routine measurement software.

    The Helium seal means the optics are always under vacuum. As mentioned above the unique 30μ tube delivers superior light element performance. The instrument’s small footprint makes effective of valuable lab space.

    Additionally the ZSX Primus is capable of micro analysis to 500 µm and elemental of topography and/or distribution is possible.

  • Rigaku’s new Smart Sample Loading System (SSLS) adds a new dimension of flexibility to the ZSX Primus WDXRF spectrometer. For sample types that are amenable to such a process, a vacuum chuck can be used to load samples into pre-loaded sample holders. This sample loading system has two important consequences: time is saved by the operator since they are no longer required to manually load each sample in a sample cup and the number of samples that can be held on the sample deck is increased significantly

  • All
  • CL
  • CLEM
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fusion
  • In situ
  • Micro XRF
  • Microscopy
  • Sample Preparation
  • SEM
  • WDS
  • XRF