Quasor II™ EBSD System

Making EBSD a reality

Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterises crystalline structures which affect physical properties in a wide range of materials examined with scanning electron microscopes (SEMs) and X-ray microanalysis

  • Key Features

    • Collection rates up to 600 frames per second with > 99% pixels indexed and three times better signal-to-noise than other CMOS cameras. Integrated with Pathfinder X-ray microanalysis for simultaneous EDS/WDS and EBSD data collection where one measurement provides both structural and chemical information about the sample
    • Diffraction pattern processing and Band detect - Background removal by subtraction or division, image cropping and Flat Fielding with FFT or parabolic. Choice of number of bands detected up to 30 and image normalisation by line length or Hough background
    • Designed for metallurgy - Perform phase identification and transformation analysis following heating and cooling, identify phases and size grains, monitor heat affected zones after welding, run predictive fracture analysis in metals or validate additive manufacturing processes
  • All
  • AFM/SPM/SNOM
  • Automated Mineralogy
  • CL
  • CLEM
  • Diffraction Imaging
  • DNA/RNA
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • Hyperspectral
  • In situ
  • Micro XRD
  • Micro XRF
  • Microscopy
  • Molecular Biology
  • Powder
  • Protein
  • Protein Crystallography
  • Raman
  • SAXS/WAXS
  • SEM
  • Small Molecule
  • Spectroscopy
  • TEM
  • Thermal Probe Lithography
  • Thin Film
  • WDS
  • XRD
  • XRF