Nexsa G2

High Performance XPS with Multiple Surface Analysis Technique Integration

Nexsa puts world-class XPS (X-ray Photoelectron Spectroscopy) surface analysis and related techniques into the hands of non-experts with minimal training and effort

  • Thermo Scientific NEXSA G2 XPS surface analysis platform

    Key Features

    • Insulator analysis Best in class and fully automated charge compensation
    • High performance spectroscopy Highly automated, producung research grade XPS data
    • Depth profiling Fully automated depth profiling using a Dual-source ion source (MAGCIS)
    • Multi-technique integration Automated XPS, UPS, ISS, REELS and RAMAN aquisition of the same spot
    • Tilt Module for ARXPS measurements Accurate and easy ARXPS measurement
    • Dynamic experiments In situ sample heating and biasing
    • Avantage Software for instrument control, data processing, and reporting
    • Small spot analysis
    • SnapMap Fast and accurate analysis on unknown samples

The Nexsa G2 (launched in May 2021) delivers significant software and hardware improvements that enable researchers to uncover comprehensive surface chemistry insights. It also offers the potential for product advancements through greater sample throughput and correlative analysis compared to the previous Nexsa model. Software improvements and improved automation enable users to strengthen data integrity with robust results and fast sample acquisition, with the ability to easily correlate information obtained from a range of integrated analysis techniques.

Furthermore, Nexsa G2 boasts improved sensitivity, capable of detecting weak signals below 0.1% more easily, producing reliable, high-quality data, enhancing the development and safety of a variety of products.


With new levels of simplicity and automation, Nexsa G2 has many applications, both in industry and academic research. Some of these include:

  • Batteries
  • Medical implants
  • Semiconductors
  • Catalysts
  • Polymers
  • Metals
  • Geology
  • Oil and gas
  • Nanoparticles
  • Fibres and filters
  • 2D materials
  • Forensics
  • Thermo NEXSA complimentary surface analysis techniques

    Multiple Complementary Surface Anlaysis Techniques

    Nexsa G2 allows users to integrate multiple surface analysis techniques so you can conduct true correlative analysis.

    • XPS – X-ray Photoelectron Spectroscopy
    • ISS – Ion Scattering Spectroscopy
    • UPS – UV Photoelectron Spectroscopy
    • REELS – Reflected Electron Energy Loss Spectroscopy
    • AES – Auger Electron Spectroscopy
    • Raman spectroscopy
  • High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!

  • XPS – John Watts, Professor of Materials Science, University of Surrey

  • All
  • CL
  • Diffraction Imaging
  • Hyperspectral
  • Laser spectroscopy
  • LIBS
  • NMR
  • Pre-clinical Imaging
  • Raman
  • SEM
  • Spectrophotometry
  • Spectroscopy
  • X-ray absorption spectroscopy (XANES/EXAFS)
  • X-ray Imaging
  • X-ray Microscopy
  • XRD & Diffraction