NEXSA

High Performance XPS with Multiple Surface Analysis Technique Integration

NEXSA puts world-class XPS (X-ray Photoelectron Spectroscopy) surface analysis and related techniques into the hands of non-experts with minimal training and effort

Key Features
- Insulator analysis Best in class and fully automated charge compensation
- High performance spectroscopy Highly automated and research grade XPS data
- Depth profiling Fully automated depth profiling using a Dual-source ion source
- Multi-technique integration Automated XPS, UPS, ISS, REELS and RAMAN aquisition f the same spot
- Tilt Module for ARXPS measurements Accurate and easy ARXPS measurement
- Avantage Software for instrument control, data processing, and reporting
- Small spot analysis
- SnapMap Fast and accurate analysis on unknown samples

High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!

XPS – John Watts, Professor of Materials Science, University of Surrey

All
ARPES
CL
Diffraction Imaging
Hyperspectral
Laser spectroscopy
LIBS
Molecular Biology
Multiphoton Microscopy
Pre-clinical Imaging
Raman
SEM
Spectrophotometry
Spectroscopy
X-ray absorption spectroscopy (XANES/EXAFS)
X-ray Imaging
X-ray Microscopy
XRD

MISSION:COBRA

LIBSSpectroscopy

MISSION:COBRA Process optimisation with the Continuous On Belt Real time Analysis of minerals and chemistry

QuantumLeap XAS

SpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

X-ray Absorption Spectroscopy (XAS)

QM Quantum Microscope

ARPESDiffraction ImagingLaser spectroscopy

Completely configurable, the QM comprises a laser source (EUV and/or VUV), amplifier, beamline tailored to the user’s experiment, and imaging or other analysis workstations that can effectively cover the microscopy/spectroscopy landscape for nano-to-quantum materials

XUUS4

ARPESLaser spectroscopySpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

A bench top source for EUV and soft X-rays

Y-Fi VUV – vacuum ultraviolet source

ARPES

KMLabs Y-Fi™ VUV provides bright femtosecond pulses at numerous wavelengths across the vacuum ultraviolet (VUV) region, from 6.0 eV (205 nm) to 10.8 eV (115 nm). The discrete tunability of the KMLabs Y-Fi VUV vacuum ultraviolet source enables researchers to study a wide range of materials and materials properties

RAEA Amplifier

ARPESLaser spectroscopy

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC

CLHyperspectralRamanSEMSpectroscopy

SPARC: High-performance SEM cathodoluminescence detector

Y-Fi™ ULTRAFAST Yb FIBER LASERS

Laser spectroscopyMultiphoton Microscopy

A unique, world-leading, series of high average power, multi-MHz repetition-rate ultrafast fiber lasers

Spellman HV Solutions

Spectroscopy

High Voltage Solutions for a wide range of Applications and Techniques

Ti:Sapphire Laser Oscillators

Laser spectroscopySpectrophotometry

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

Hound

LIBSMolecular BiologyRaman

The unrivaled chemical and elemental particle identification platform.

Compact Light Source

Pre-clinical ImagingX-ray absorption spectroscopy (XANES/EXAFS)X-ray ImagingX-ray MicroscopyXRD

NEXSA puts world-class XPS (X-ray Photoelectron Spectroscopy) surface analysis and related techniques into the hands of non-experts with minimal training and effort