NEXSA

High Performance XPS with Multiple Surface Analysis Technique Integration

NEXSA puts world-class XPS (X-ray Photoelectron Spectroscopy) surface analysis and related techniques into the hands of non-experts with minimal training and effort

Key Features
- Insulator analysis Best in class and fully automated charge compensation
- High performance spectroscopy Highly automated and research grade XPS data
- Depth profiling Fully automated depth profiling using a Dual-source ion source
- Multi-technique integration Automated XPS, UPS, ISS, REELS and RAMAN aquisition f the same spot
- Tilt Module for ARXPS measurements Accurate and easy ARXPS measurement
- Avantage Software for instrument control, data processing, and reporting
- Small spot analysis
- SnapMap Fast and accurate analysis on unknown samples

High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!

XPS – John Watts, Professor of Materials Science, University of Surrey

All
ARPES
CL
Diffraction Imaging
Hyperspectral
Laser spectroscopy
LIBS
Multiphoton Microscopy
Pre-clinical Imaging
Raman
SEM
Spectrophotometry
Spectroscopy
X-ray absorption spectroscopy (XANES/EXAFS)
X-ray Imaging
X-ray Microscopy
XRD

MISSION:COBRA

LIBSSpectroscopy

MISSION:COBRA Process optimisation with the Continuous On Belt Real time Analysis of minerals and chemistry

QuantumLeap XAS

SpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

X-ray Absorption Spectroscopy (XAS)

QM Quantum Microscope

ARPESDiffraction ImagingLaser spectroscopy

Completely configurable, the QM comprises a laser source (EUV and/or VUV), amplifier, beamline tailored to the user’s experiment, and imaging or other analysis workstations that can effectively cover the microscopy/spectroscopy landscape for nano-to-quantum materials

XUUS4

ARPESLaser spectroscopySpectroscopyX-ray absorption spectroscopy (XANES/EXAFS)

A bench top source for EUV and soft X-rays

Y-Fi VUV – vacuum ultraviolet source

ARPES

KMLabs Y-Fi™ VUV provides bright femtosecond pulses at numerous wavelengths across the vacuum ultraviolet (VUV) region, from 6.0 eV (205 nm) to 10.8 eV (115 nm). The discrete tunability of the KMLabs Y-Fi VUV vacuum ultraviolet source enables researchers to study a wide range of materials and materials properties

RAEA Amplifier

ARPESLaser spectroscopy

RAEA is KMLabs' sub-25 fs, single-box amplifier. It is a fully engineered and integrated commercial source based on a single rugged optomechanical platform with a unique software-tunable repetition rate in order to maximise experiment flexibility

SPARC

CLHyperspectralRamanSEMSpectroscopy

SPARC: High-performance SEM cathodoluminescence detector

Y-Fi™ ULTRAFAST Yb FIBER LASERS

Laser spectroscopyMultiphoton Microscopy

A unique, world-leading, series of high average power, multi-MHz repetition-rate ultrafast fiber lasers

Spellman HV Solutions

Spectroscopy

High Voltage Solutions for a wide range of Applications and Techniques

Ti:Sapphire Laser Oscillators

Laser spectroscopySpectrophotometry

Ti:sapphire is the workhorse of ultrafast lasers due to its high gain bandwidth, enabling delivery of the shortest pulses and scalable to high pulse energy and average power. KMLabs provides a full suite of modelocked oscillators and integrated oscillator-amplifier systems, spanning pulse energies from the nJ range to 30 mJ in pulses from 15 to 40 fs.

Compact Light Source

Pre-clinical ImagingX-ray absorption spectroscopy (XANES/EXAFS)X-ray ImagingX-ray MicroscopyXRD

NEXSA puts world-class XPS (X-ray Photoelectron Spectroscopy) surface analysis and related techniques into the hands of non-experts with minimal training and effort