NEXSA
High Performance XPS with Multiple Surface Analysis Technique Integration

NEXSA puts world-class XPS (X-ray Photoelectron Spectroscopy) surface analysis and related techniques into the hands of non-experts with minimal training and effort
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Key Features
- Insulator analysis Best in class and fully automated charge compensation
- High performance spectroscopy Highly automated and research grade XPS data
- Depth profiling Fully automated depth profiling using a Dual-source ion source
- Multi-technique integration Automated XPS, UPS, ISS, REELS and RAMAN aquisition of the same spot
- Tilt Module for ARXPS measurements Accurate and easy ARXPS measurement
- Avantage Software for instrument control, data processing, and reporting
- Small spot analysis
- SnapMap Fast and accurate analysis on unknown samples
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High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!
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XPS – John Watts, Professor of Materials Science, University of Surrey
- All
- ARPES
- CL
- Diffraction Imaging
- Hyperspectral
- Laser spectroscopy
- LIBS
- Pre-clinical Imaging
- Raman
- SEM
- Spectrophotometry
- Spectroscopy
- X-ray absorption spectroscopy (XANES/EXAFS)
- X-ray Imaging
- X-ray Microscopy
- XRD