High Performance XPS with Multiple Surface Analysis Technique Integration

NEXSA puts world-class XPS (X-ray Photoelectron Spectroscopy) surface analysis and related techniques into the hands of non-experts with minimal training and effort

  • Key Features

    • Insulator analysis Best in class and fully automated charge compensation
    • High performance spectroscopy Highly automated and research grade XPS data
    • Depth profiling Fully automated depth profiling using a Dual-source ion source
    • Multi-technique integration Automated XPS, UPS, ISS, REELS and RAMAN aquisition of the same spot
    • Tilt Module for ARXPS measurements Accurate and easy ARXPS measurement
    • Avantage Software for instrument control, data processing, and reporting
    • Small spot analysis
    • SnapMap Fast and accurate analysis on unknown samples
  • High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!

  • XPS – John Watts, Professor of Materials Science, University of Surrey

  • All
  • CL
  • Diffraction Imaging
  • Hyperspectral
  • Laser spectroscopy
  • LIBS
  • Pre-clinical Imaging
  • Raman
  • SEM
  • Spectrophotometry
  • Spectroscopy
  • X-ray absorption spectroscopy (XANES/EXAFS)
  • X-ray Imaging
  • X-ray Microscopy
  • XRD