Model 1080 PicoMill

Set the standard for high-quality TEM specimen preparation

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest

  • Key Features

    • Site-specific, ultra-low-energy milling - The PicoMill system’s ion source features a filament-based ionisation chamber and electrostatic lenses. The ion source was specifically developed to produce ultra-low ion energies with a submicron ion beam diameter. It uses inert gas (argon) and has an operating voltage range of 50 eV to 2 kV
    • Precise milling angle adjustment - The ion beam impingement angle is programmable from -15 to +90° and is achieved by tilting the specimen holder to the programmed milling angle using the goniometer
    • In situ imaging - To complement the scanning electron column, the PicoMill system has a backscatter electron detector (BSE), a secondary electron detector (SED) and a scanning/transmission electron detector (STEM) for endpoint detection
  • All
  • ARPES
  • Diffraction Imaging
  • EBSD
  • EDS
  • Electron Beam Lithography (EBL)
  • Electron Microscopy
  • Fabrication
  • FIB
  • In situ
  • Laser spectroscopy
  • Micro XRD
  • Microscopy
  • SEM
  • TEM
  • Thermal Probe Lithography