Model 1080 PicoMill

Set the standard for high-quality TEM specimen preparation

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. Let the FIB do what the FIB does best; let the PicoMill system do the rest

Key Features
- Site-specific, ultra-low-energy milling - The PicoMill system’s ion source features a filament-based ionisation chamber and electrostatic lenses. The ion source was specifically developed to produce ultra-low ion energies with a submicron ion beam diameter. It uses inert gas (argon) and has an operating voltage range of 50 eV to 2 kV
- Precise milling angle adjustment - The ion beam impingement angle is programmable from -15 to +90° and is achieved by tilting the specimen holder to the programmed milling angle using the goniometer
- In situ imaging - To complement the scanning electron column, the PicoMill system has a backscatter electron detector (BSE), a secondary electron detector (SED) and a scanning/transmission electron detector (STEM) for endpoint detection

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TEM
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