A state-of-the-art ion milling and polishing system
Table top precision preparation for producing high quality TEM samples for a wide variety of applications
Two independently adjustable ion sources - The patented TrueFocus ion sources are optimised to perform at near 100% ionisation efficiency and possesses an independent ion source energy control resulting in a highly efficient ion source that maintains a consistent beam current. TrueFocus ion sources maintain a small ion beam diameter, even at a low accelerating voltage, which means that the ions are directed only to the sample and that sputtered material is not redeposited from the sample holder or chamber onto the sample
Precise angle adjustment - The continuously adjustable ion source tilt angles range from -15 to +10°. This extended tilt angle range accommodates specimens mounted on slotted grids. Sample rotation is 360° with variable rotation speed and a sample rocking feature
Automatic termination - A timer allows milling to continue for a predetermined time and then turns off energy to the ion sources. The specimen remains under vacuum until the load lock is vented. Alternatively, The specimen cooling system thermal safeguard will stop the process if the specimen stage reaches a preset temperature
Automated milling angle adjustment
Automated milling angle adjustment using the touch screen is an available option for the TEM Mill. Adding this capability enables you to create multi-step milling sequences that include the automatic adjustment of milling angles throughout the milling process.
A laser light source and a photodetector sense transmission of light through the specimen. A programmable sensitivity control automatically stops the ion milling process as the specimen becomes translucent.
Liquid nitrogen-cooled sample stage
Although milling at low angles with low ion beam energies reduces sample heating, temperature-sensitive samples may require further cooling. The SEM Mill’s liquid nitrogen system features a dewar located within the enclosure that is fully integrated and interlocked effectively eliminating heat-induced artifacts.
In situ sample viewing
The ion milling process can be monitored in situ in the milling position when using either the optional stereo or the high-magnification microscope. The stereo microscope (7 to 45 X) enhances sample viewing and with its long working distance allows the sample to be observed in situ while milling. The 1,960 X high magnification microscope coupled to a CMOS camera and video monitor to view samples and capture images in situ during milling. This system is ideal for preparing site-specific samples.
Vacuum or inert gas transfer capsule
An optional vacuum capsule allows you to transfer the sample to the SEM under vacuum or in an inert gas.