Lumis EBSD Detector

EBSD technology designed for maximum throughput and high resolution

Rapidly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology designed for maximum throughput and high resolution. The Thermo Scientific™ Lumis EBSD detector incorporates new CMOS sensor technology and advanced optics

Key Features
- CMOS sensor technology - The Lumis EBSD detector incorporates the most developed CMOS sensor technology available with advanced optics and accelerating indexing algorithms for the analysis of electron backscatter patterns (EBSPs) using probe currents down to 10 pA and below
- With pattern collection at >2.2 million pixels, the detector is ideally suited to HR-EBSD strain measurement and phase identification applications
- High speed EBSD - Using optical and sensor binning, the detector can be optimized for high speed EBSD at several thousand frames per second for reduced collection times and higher sample throughputs. The advanced optics and high sensor sensitivity allow EBSPs to be acquired at ultra-low probe currents below 10 pA. This is particularly important for beam sensitive and dose restricted materials, or in cases where higher probe current may introduce contamination or drift
- Reverse zoom optic - A large format CMOS sensor and a patented reverse zoom optic to complement and extend the built-in CMOS sensor binning. A high efficiency, octagonal scintillator converts the electron backscatter electrons into light, which is focused on to a user-controlled region of the sensor by the high-quality reverse zoom optic. This allows a continuous choice of "binned" EBSP size and gives full flexibility over EBSP speed, quality and sensitivity

Related Products

chameleon

chameleon

Electron MicroscopyMicroscopySEM

Rapid progress to the perfect ice thickness for your cryo-EM sample

AttoMap

AttoMap

EDSMicro XRFWDSXRF

High resolution micro-XRF

SPARC

SPARC

CLHyperspectralRamanSEMSpectroscopy

SPARC: High-performance SEM cathodoluminescence detector

UltraDry EDS Detector

UltraDry EDS Detector

EDS

Develop faster, more accurate interpretation of X-rays for industries such as metals and mining, advanced materials and semiconductors with the Thermo Scientific™ UltraDry EDS Detector, which provides superior resolution at incredibly high collection rates for the Thermo Scientific™ Pathfinder™ X-ray Microanalysis Software.

Eucentric Five Axis Table

Eucentric Five Axis Table

EDSFIBSEM

The E5AT stage is a five-axis positioning tool especially designed to allow tilting samples to ±90 deg while allowing unlimited rotation of the sample and keeping the area of interest at the eucentric position.

S9000X

S9000X

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

Ultra-high resolution plasma FIB SEM

Model 1070 NanoClean

Model 1070 NanoClean

Electron MicroscopySEMTEM

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis

Model 1061 SEM Mill

Model 1061 SEM Mill

EBSDEDSMicro XRFSEMWDS

Table top precision preparation for producing high quality SEM samples for a wide variety of applications

Heating Module

Heating Module

In situSEM

A stable heating module capable of temperatures up to 1500°C for a range of in situ SEM studies with gas capable micro-environments enabled

Cryo Module 80 Kelvin

Cryo Module 80 Kelvin

Electron MicroscopyFIBIn situSEM

An extremely low vibration level cryo module that runs on liquid nitrogen, adding new capabilities to your SEM

Electrostatic Beam Blanker

Electrostatic Beam Blanker

CLSEM

With rise time values <100 picoseconds, this beam blanker is ideally suited to the fast stroboscopic imaging required in voltage contrast, EBIC, OBIC, time-resolved cathodoluminescence and electron-beam lithography

SEM Add-on Tools

SEM Add-on Tools

In situSEM

Ingenious add-on tools for in situ experimentation that brings new capabilities to your SEM

Transfer Module

Transfer Module

Electron MicroscopyFIBIn situSEM

Made for the purpose of carrying delicate and sensitive specimens in a capsule from the SEM into a glove box, or vice versa, to ensure they are protected from air or moisture at all times.

Bending Module

Bending Module

In situSEM

World leading in situ materials testing of bending characteristics using your SEM

Quasor II™ EBSD System

Quasor II™ EBSD System

EBSDEDSFIBMicro XRDSEM

Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterises crystalline structures which affect physical properties in a wide range of materials examined with scanning electron microscopes (SEMs) and X-ray microanalysis

MIRA3

MIRA3

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Versatile and powerful FEG SEM

JOLT

JOLT

CLEDSSEM

Panchromatic and RGB Cathodoluminescence (CL) detector

VEGA3

VEGA3

CLCLEMEBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyIn situMicro XRFSEMWDS

Versatile and powerful tungsten SEM

S8000G

S8000G

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

TESCAN S8000G; the most versatile and universal analytical Xe plasma FIB-SEM platform in the market

S8000X

S8000X

EBSDEDSElectron Beam Lithography (EBL)Electron MicroscopyFabricationFIBIn situMicroscopySEMTEMThermal Probe Lithography

TESCAN S8000X; the most modern Xe plasma FIB SEM

SmartLab SE

SmartLab SE

Micro XRDPowderSAXS/WAXSThin FilmXRD

Multipurpose XRD and Materials Analysis

SmartLab

SmartLab

Micro XRDPowderSAXS/WAXSThin FilmXRD

The pinnacle instrument for X-ray materials analysis

XtaLAB Synergy-R

XtaLAB Synergy-R

Micro XRDProtein CrystallographySmall MoleculeXRD

X-ray crystallography at it's finest

XtaLAB Synergy-i

XtaLAB Synergy-i

Micro XRDSmall MoleculeXRD

Beauty in the simplicity of design

XtaLAB Synergy-DW

XtaLAB Synergy-DW

DNA/RNAMicro XRDMolecular BiologyProteinProtein CrystallographySmall MoleculeXRD

X-ray crystallography at it's finest

XtaLAB Synergy-Custom

XtaLAB Synergy-Custom

DNA/RNAMicro XRDMolecular BiologyPowderProteinProtein CrystallographySmall MoleculeXRD

Your customised Home-Lab Light Source for X-ray Crystallography and BioSAXS

XtaLAB Synergy-S

XtaLAB Synergy-S

Micro XRDPowderProtein CrystallographySmall MoleculeXRD

The world's favourite X-ray crystallography system

TIMA-X

TIMA-X

Automated MineralogyEDSSEM

MM3E Micromanipulator

MM3E Micromanipulator

Electron MicroscopyFIBIn situSEM

Adding capabilities from in situ lift-out, electrical probing (FA)and nano-manipulation, the encoded MM3E micro-manipulator brings new functionality to your SEM or FIB/SEM instrument

Tensile/Compression Module

Tensile/Compression Module

EBSDEDSIn situSEM

World leading in situ materials testing of tensile and compression characteristics using your SEM

SuperFlat AFM

SuperFlat AFM

AFM/SPM/SNOMIn situSEM

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens the possibility of combining information on lateral dimensions and material from SEM inspection that can be readily complemented by precise topographical and force information in situ

EBIC Characterisation System

EBIC Characterisation System

In situSEM

An easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's making it the ideal choice for circuit testing and probing.

NanoWorkstation

NanoWorkstation

FIBIn situSEM

The NanoWorkstation is a powerful, dedicated system that allows physical manipulation and characterisation at the micro and nano-scale with ease adding new capabilities to your SEM or FIB/SEM instrument.

UltraDry Compact EDS Detector

UltraDry Compact EDS Detector

EDS

Entry-level SDD EDS that combines UltraDry EDS technology with the Thermo Scientific™ Pathfinder™ X-ray Microanalysis Software, which includes project-based data management, template-based acquisition and operation, Point & Shoot analysis, standardless quantification, and full dead-time corrected Spectral Imaging for the ultimate in EDS data collection and analysis.