RAPID II – Compact, Fully Integrated High-Resolution, Small Molecule Crystallography System

A compact, fully integrated high-resolution, small molecule crystallography system, the Rigaku RAPID II is the latest member of the RAPID family of large-area curved imaging plate (IP) X-ray diffraction systems. The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallography.

The Rapid II is available in two variants:

  1. Conventional powder/thin films using the D/MAX-RAPID II
  2. Small molecule R-AXIS RAPID II

The flexible system works with wavelengths from Cr to Ag without compromising data quality. The extremely large aperture means that the full resolution range for any wavelength can be covered very easily. The R-AXIS RAPID is the system of choice for the most demanding applications, including charge-density work, complicated twins and studies on diffuse scattering. Other applications include micro-diffraction, measurement of weakly diffracting disordered materials, wide angle X-ray scattering (WAXS), stress and texture measurements, and general purpose powder diffraction.

Curved Detector for Maximum Reciprocal Space Coverage

The RAPID II is so versatile that it can replace several instruments without compromising data quality. Its unique, curved large-area detector subtends a 2θ range of 204° at a single detector setting for maximum reciprocal space coverage.

Advantages of the curved large-area detector include:

  1. A massive solid angle of data is collected in a single exposure
  2. The wide dynamic range eliminates concerns about detector saturation
  3. The curved-plate geometry of the RAPID II reduces oblique-incidence X-ray absorption effects seen with flat detectors of any kind.

Choice of X-ray sources, including dual wavelength

Inherent to the flexibility of this system is a choice of X-ray sources, ranging from a high-frequency 3 kW sealed tube, to a MicroMax-003 microfocus tube, to a 1.2 kW MicroMax™-007 HF microfocus rotating anode.

Available optics range from a traditional graphite monochromator or high-performance SHINE™ optic to a VariMax™ confocal X-ray optic. Dual wavelength is available with the new MicroMax-007 HF DW or FR-E+ DW SuperBright™ optional sources. In this novel approach, two optics are housed in a single assembly, with either optic being selected by a simple rotation. In addition, the patented adjustable divergence feature is maintained for each optic.


  • No compromise molecular structure determination
  • Multiple and dual wavelengths available
  • Cu, Mo, Ag, etc.
  • Fast data collection
  • High dynamic range and low background noise
  • High-resolution charge density measurements
  • Measure weakly diffracting disordered materials
  • Powder diffraction
  • Micro-diffraction
  • Diffuse scattering

Case Studies

Qualitative Analysis of an Antique Japanese Painting Using X-Ray Microdiffraction (587Kb PDF)