DualSource Rapid II – Wavelength Switchable X-Ray Diffractometer (XRD)

The DualSource Rapid II is the latest addition to the Rapid II family. It features a Cu microfocus sealed beam tube and a Mo standard sealed beam tube. This combination provides the best performance for crystallographers in a wavelength switchable x-ray diffractometer.

System Advantages

  • Large aperture size – a 204° capture angle ensures you are collecting as much data from your crystal during an exposure reducing the number of images that need to be collected
  • Low Noise – the large aperture and lack of electronic noise are suited to diffuse scattering measurements in particular on small samples requiring log exposure times
  • Simplicity – simple design provides ease of use and enables in-field repairs if required

Key Features

Key features of the DualSource Rapid II include:

  • Macromolecular structure determination
  • Standard three dimensional structure determination from single crystals
  • Determination of absolute structure of chiral compounds
  • Complete high-resolution data for charge-density modelling
  • Structure determination from very small crystals
  • Diffuse scattering patterns employing long X-ray exposures
  • High pressure measurements using a diamond anvil cell
  • Supramolecular structures (meta-structures, often with large unit cells)
  • Complete handling of twinned and modulated crystals
  • Phase ID of powder samples
  • Fibre diffraction patterns